Nikon Metrology Nv

Hans Thielemans

Frank Thys

Raf Nysen

Laurens Van Horenbeek

The present invention provides a dimensional measurement probe unit () for attachment to a probe head () of a localizer (), comprising: a measurement probe () for dimensional measurement of an object (); a revolute joint () integrated into the measurement probe (); and a probe unit interface () for repeated dismountable connection to a probe head () wherein the probe unit interface () is revolutely connected to the measurement probe () by the revolute joint ().

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Rotselaar, Belgium

Hans Thielemans