Koninklijke Philips Corporation N.V.

Philips Intellectual Property & Standards Gmbh

Hans Peter Sprong

Serverius Petrus Paulus Pronk

Johannes Henricus Maria Korst

Rainer Kiewitt

Tiblets Zeray Demewez

Martin Kimutai Duerr

A non-transitory computer readable medium () stores instructions executable by at least one electronic processor () to perform a method () of monitoring a component () of a medical device (), particularly an x-ray tube. The method includes: retrieving information about the component from the medical device: deriving a wear metric indicative of wear of a portion, particularly the filament, of the component from the retrieved information; and in response to the wear metric satisfying a predetermined manual adjustment prohibition criterion, outputting an alert () indicating that the component of the medical device is nearing an end of its remaining useful life (RUL), and optionally that manual calibration should not be performed on the component.

Systems and methods to improve X-ray tube filament failure prediction

The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier () is provided with an aperture () for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation () with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X-ray sensor can be positioned inside the beam formation (), but outside the 'actual field of view' () as determined by a diaphragm ().

Determining changes in the x-ray emission yield of an x-ray source

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Eindhoven, Netherlands

Hans Peter Sprong