Arnold&richter Cine Technik Gmbh&co. Betriebs Kg

Arri Medical Gmbh

Munich Surgical Imaging Gmbh

Hans Kiening

Peter Geissler

Julius Muschaweck

Manuel Millahn

Martin Kiening

Andreas Fritz

Patrick Burckstummer

Ralf Engelhardt

An electronic microscope has an electronic image sensor for generating primary image data sets, wherein the image sensor is configured to generate image signals that correspond to a plurality of different reception spectra, and wherein each primary image data respectively comprises at least one image signal of each of the plurality of reception spectra for a plurality of image zones. A control device of the microscope is configured to control an illumination device to make a cyclically repeating transmission of electromagnetic radiation having a plurality of different illumination spectra and to control the image sensor to generate a respective primary image data set for each of the plurality of different illumination spectra. A processing unit of the microscope is configured to calculate the reflection spectrum from the generated primary image data sets for at least some of the plurality of image zones and, starting from the primary image data sets generated for the plurality of different illumination spectra, to determine at least one secondary image data set in dependence on the calculated reflection spectrum, said secondary image data set being at least partly modified with respect to the primary image data sets.

Electronic microscope

An electronic microscope, in particular a surgical microscope, comprises a camera unit that has at least one electronic image sensor for generating primary image data sets and that comprises an imaging optics for generating an image of an object on the image sensor. The microscope further comprises an electronic viewfinder, an adjustment device for varying a focal position of the camera unit, a control device, and a computing device. The control device is adapted to control the adjustment device to make a cyclically repeating variation of the focal position of the camera unit between a plurality of focal values and to control the image sensor to generate a respective primary image data set for each of the plurality of focal values. The computing device is adapted to determine a secondary image data set from the primary image data sets generated for the plurality of focal values, said secondary image data set having an extended depth of field relative to the respective primary image data sets.

An electronic stereoscopic microscope for detecting and reproducing pairs of stereoscopic part images comprises a camera unit having at least one electronic image sensor, a dog-leg objective for generating an image of an object on the image sensor, wherein the objective comprises a first leg facing the object to be imaged, a second leg facing the image sensor and including an angle with the first leg and deflection means provided between the legs, wherein the first leg extends along an imaging axis and the second leg extends along a detection axis. The microscope furthermore comprises an electronic viewfinder for reproducing stereoscopic part images detected by means of the image sensor, with the electronic viewfinder being arranged in an observation position or being movable into an observation position which is provided at a rear side of the objective in an extension of the imaging axis.

Stereoscopic microscope

The invention relates to a test apparatus for the checking of the exposure quality of an exposed film, in particular of a motion film. A test pattern holder serves for the holding of a test pattern of the exposed film. A reference pattern with at least one reference mark is provided in superimposition with respect to the test pattern held by the test pattern holder. A light transmitter serves for the illumination of the test pattern held by the test pattern holder and of the reference pattern superimposed herewith. A light receiver is provided for the reception of the light transmitted through the reference pattern and through the test pattern and for the generation of corresponding electrical received signals. An evaluation device evaluates these received signals with respect to at least one quality parameter. The invention furthermore relates to a corresponding test method.

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Lenggries, Germany

Hans Kiening