Micronas Gmbh

Denso Corporation

Tdk-micronas Gmbh

Hans-Jörg Fink

Martin Bayer

Reiner Bidenbach

Yoshiyuki Kono

Manfred F Ullrich

Manfred Ullrich

Thilo Rubehn

Andreas Ring

Tomas Kauter

A method for programming a two-wire sensor having at least two sensor units. The method comprises the following steps of: switching on the at least two sensor units, activating one of the at least two sensor units, capturing operating states of the at least two sensor units; detecting an operating state in which one individual sensor unit is active; and sending a programming command to the detected active sensor unit.

Method for programming a two-wire sensor and programmable two-wire sensor

In a process for testing the measurement accuracy of at least one magnetic field sensor, in particular during manufacturing, a semiconductor wafer that has at least two semiconductor chips is provided. A measurement coil is integrated into at least one first semiconductor chip, and a magnetic field-sensitive electric circuit is integrated into at least one second semiconductor chip that forms the magnetic field sensor. The first semiconductor chip, of which at least one is present, is positioned at an exciter coil that is supplied with current in order to generate a reference magnetic field. With the aid of the measurement coil a first measured value that is dependent on the magnetic flux density is acquired and the current in the exciter coil is adjusted depending on the first measured value. The second semiconductor chip, of which at least one is present, is positioned at the exciter coil. With the aid of the electronic circuit a second measured value that is dependent on the magnetic flux density is acquired and compared with a reference value range.

Method to test the measurement accuracy of at least one magnetic field sensor using a semiconductor chip having a measurement coil

A procedure for checking the operational capability of an electric circuit, which has a sensor module and a diagnosis mechanism with the sensor module including an integrated switching circuit, wherein the sensor module has at least one output terminal connected to the diagnosis mechanism and power supply terminals, and wherein an operating voltage is applied via cables to the power supply terminals. The sensor module is switched to a test mode, in which a communication test signal is emitted from the output terminal. This signal is read in by the diagnostic mechanism and compared with a tolerance band range, in order to verify that the communication with the sensor module is operational. In the event of operational communication, the operational capability of the switching circuit is tested.

Procedure for checking the operational capability of an electric circuit

Disclosed is a method and device for transmitting data between at least two transmitters and a receiver which are connected to a bus. A synchronization signal is applied to the bus and a number of data volume counters corresponding to the number of transmitters reduced by one is set to a predefined initial value. A first transmitter transmits in the form of data elements a predefined data volume allocated to the transmitter over the bus to the receiver. The data volume values of the other transmitters are selected so that only one transmitter at any given time simultaneously transmits on the bus.

Communication device and method for improved synchronous data transmission

Disclosed is an integrated electronic circuit comprising a core circuit that generates a useful signal as well as a buffer for storing the useful signal. The buffer stores the last read value of the useful signal for a predetermined period of time when the power supply is interrupted, and the buffer is disconnected from the power supply of the other circuits.

Integrated electronic circuit

A method and circuitry for checking the programming (P) and deletion (L) operations of memory cells () in a nonvolatile memory device (). Parallel to the programming (P) or deletion (L) operations of the actual memory cells () the respective programming or deletion process is carried out on at least one similar checking cell (), with the programming (P) or deletion (L) operations being less favorable by a defined extent than the programming (P) or deletion (L) operations of the actual memory cells (). From the content of the checking cell () an evaluation device () determines whether the programming (P) or deletion (L) operation was successful or not, and a corresponding output signal (ak) indicative thereof is produced.

Growing community of inventors

Freiburg, Germany

Hans-Jörg Fink