Siemens Aktiengesellschaft

Hans-Joergen Bode

Achim Dallmann

Klaus Lueders

A circuit configuration includes a plurality of identical circuit blocks, at least one input terminal, at least one output terminal, a comparison device and a controlled switching device. The controlled switching device is to be connected to the identical circuit blocks, to the comparison device, to the at least one input terminal and to the at least one output terminal for coupling the identical circuit blocks to each other. The controlled switching device couples the at least one input terminal to the input side of the identical circuit blocks for supplying a path for input test patterns from the at least one input terminal to the identical circuit blocks. The controlled switching device couples the output side of the identical circuit blocks to the comparison device for supplying a path for output test patterns from each of the identical circuit blocks to the comparison device. The comparison device compares the output test patterns from each of the identical circuit blocks, and the comparison device generates an error signal after detecting incompatible test output patterns for external processing. The controlled switching device also couples the comparison device to the at least one output terminal.

Testable circuit configuration having a plurality of identical circuit

An electronic component with a shift register test architecture (boundary scan) includes test cells. A register cell in a test cell is programmable with a manufacturer datum.

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Hans-Joergen Bode