Telefonaktiebolaget Lm Ericsson (publ)

Hans Hogberg

Mikael Hedlund

A method and arrangement for testing circuit boards (60) by creating one or several reference patterns to be compared with a test pattern. The arrangement is provided with at least one measuring probe (50), which cooperates with the circuit board (60), for measuring at least one reference signal or test signal on a reference circuit board and a test circuit board (60) respectively. Further, the arrangement is provided with an analyzer (10,30), which cooperates with the measuring probe (50), to pass on the reference signal or the test signal, whereby the analyzer (10,30) first analyzes the reference signal or the test signal at one frequency and then transforms the reference signal or the test signal to a reference pattern and test pattern respectively. Furthermore, the arrangement is provided with at least one memory (20) which cooperates with said analyzer (10,30) to register said reference pattern or test pattern. The memory (20) is provided with two or several reference patterns when testing a circuit board (60).

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Kumla, Sweden

Hans Hogberg