Koninklijke Philips Corporation N.v.

U.S. Philips Corporation

Philips Intellectual Property & Standards Gmbh

Hanns-Ingo Maack

Thomas Koehler

Andriy Yaroshenko

Klaus Erhard

Ewald Roessl

Bernd Menser

Ulrich Neitzel

Detlef Mentrup

Gerhard Martens

Frank Bergner

Christoph Kurze

Thomas Pralow

Bernd Lundt

André Goossen

Sascha Andreas Jockel

Ingo Schafer

Roland Proksa

Raoul Florent

Rafael Wiemker

Thomas Buelow

Jens Von Berg

Julien Senegas

Ulrich Schiebel

Martin Bergtholdt

Heiner Daerr

Hanno Heyke Homann

Kirsten Regina Meetz

Franz Pfeiffer

Udo Van Stevendaal

Klaus Juergen Engel

Norbert Conrads

Matthias Simon

Jörg Sabczynski

Stephan G Rupp

Walter Hillen

Claire Levrier

Dominik Benjamin Kutra

Andre Goossen

Nataly Wieberneit

Dirk Manke

Jon Erik Fredenberg

Peter Benjamin Theodor Noel

Maximilian Von Teuffenbach

Tobias Reusch

Peter Noel

Fabio De Marco

Lukas Benedict Gromann

Liesbet Hilde Hadewijch Roose

Matthias Teders

Eugen Hermann

Björn Cederström

Karsten Rindt

Mats Vilhelm Lundqvist

Mathias Schlüter

Marc Hensel

Andreas Loeprich

Roland Proska

Willer Konstantin

Andreas Kloessner

Waldermar Lumma

Susanne Guenther-Kohfahl

Johannes Köpnick

A system (IPS) and related method for image processing, in particular dark-field or phase contrast imaging to reduce motion artifacts. The system comprises an input interface (IN) for receiving a series of projection images (π) acquired by an X-ray imaging apparatus (XI) of an object (OB) for a given projection direction, the imaging apparatus (XI) configured for phase-contrast and/or dark-field imaging A phase-contrast and/or dark-field image generator (IGEN) applies an image generation algorithm to compute a first image based on the series the projection images (π). A motion artifact detector (MD) detects a motion artifact in the first image. A combiner (Σ) combines, if a motion artifact is so detected, a part of the first image with a part of at least one auxiliary image to obtain a combined image. The auxiliary image was previously computed by a gated application of the image generation algorithm in respect of a subset of the series of the projection images (π). The combined image may be output at an output interface (OUT) as a motion artifact reduced image.

System and method for correcting motion artifacts by combining images in phase-contrast and dark-field imaging applications

The invention relates to a control module for controlling an x-ray system () during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit () for providing a step image quantity, a detector dose providing unit () for providing a target detector dose, an applied detector dose determination unit () for determining an applied detector dose absorbed by a part of the detector () during the acquisition of a step image, and a step image acquisition control unit () for controlling the x-ray imaging system () during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

System, method and computer program for acquiring phase imaging data of an object

The invention concerns a storage device for cleaning and charging portable X-ray detectors, and an X-ray system comprising such storage device. The storage device comprises a receiving unit for receiving at least one portable X-ray detector, a cleaning unit for cleaning the portable X-ray detector when being received by the receiving unit, and a charging unit for charging the portable X-ray detector, wherein the cleaning unit is configured for mechanically and/or chemically cleaning the portable X-ray detector. Further, the invention concerns a method of cleaning and charging a portable X-ray detector in a storage device.

Cleaning and charging portable X-ray detectors

The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface. The method comprises determining whether a projection of the reflected beam in a plane at or near the source point is present outside a central region around the source point, in which an absence of this projection outside the central region indicates that a radius of curvature of the concave reflective surface corresponds to the predetermined distance and/or that the reflective surface is substantially homogeneously curved along a curve formed by the beam impinging on the concave reflective surface.

Testing of curved X-ray gratings

The present invention relates to an apparatus () for presentation of dark field information. It is described to provide () an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (). A plurality of sub-regions of the region of interest are defined () based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived () for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned () to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region. Data representative of the region of interest is output () with figures of merit for the respective sub-regions.

Apparatus for presentation of dark field X-ray image information

Typically, a dual layer multi-spectral X-ray detector is capable of providing two points of spectral data about an imaged sample, because the front X-ray detector also acts to filter part of an incident X-ray spectrum before detection by a rear X-ray detector. A pre-filter can be placed in front of the front X-ray detector to enhance the spectral separation. However, the provision of a pre-filter implies that the intensity of the X-ray radiation must be increased to achieve the same signal to noise ratio. The present application concerns a multi-spectral X-ray detector with a front X-ray detector, a rear X-ray detector, and a structured spectral filter placed in-between them. The structured spectral filter has first and second regions configured to sample superpixels of the front X-ray detector, enabling three separate items of spectral information to be obtained per superpixel.

Multi-spectral X-ray detector

The present invention relates to processing X-ray images of an object. In order to improve the accuracy for interactive geometrical measurements, a device () for processing of an X-ray image of an object () is provided. The device comprises an input unit () and a processing unit (). The input unit is configured to provide a shape related information () from an object () to be irradiated. The input unit is also configured to provide a generic object model (), and to provide an actual X-ray image () of the object. The processing unit is configured to adapt the generic object model based on the shape related information in order to generate an individual object model (). The processing unit is also configured to determine, based on the individual object model, an individual image processing modificator () for processing at least one part of the X-ray image, and to apply the individual image processing modificator for further processing of the X-ray image.

Geometry measurements in x-ray image

The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.

Beam hardening correction in x-ray dark-field imaging

The present invention relates to an X-ray radiograph apparatus (). It is described to placing () an X-ray source () relative to an X-ray detector () to form an examination region for the accommodation of an object, wherein, a reference spatial coordinate system is defined on the basis of geometry parameters of the X-ray radiography apparatus. A camera () is located () at a position and orientation to view the examination region. A depth image of the object is acquired () with the camera within a camera spatial coordinate system, wherein within the depth image pixel values represent distances for corresponding pixels. A processing unit () transforms (), using a mapping function, the depth image of the object within the camera spatial coordinate system to the reference spatial coordinate system, wherein, the camera position and orientation have been calibrated with respect to the reference spatial coordinate system to yield the mapping function that maps a spatial point within the camera spatial coordinate system to a corresponding spatial point in the reference spatial coordinate system. A synthetic image is generated () within the reference spatial coordinate system. The synthetic image is output () with an output unit ().

X-ray radiography apparatus

An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.

System and method for dark-field-imaging

An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.

Scanning X-ray apparatus with full-field detector

The present invention relates to a device for scatter correction in an X-ray image, the X-ray image () having a superimposed structured pattern, the device () comprising: an X-ray image receiving element (); a pattern remover (); and a first subtraction module (); wherein the X-ray image receiving element () is configured to receive an X-ray image () comprising a superimposed structured pattern (); wherein the pattern remover () is configured to remove the structured pattern () from the X-ray image () resulting in a pattern corrected X-ray image (); wherein the first subtraction module () is configured to subtract the pattern corrected X-ray image () from the X-ray image () resulting in a structured pattern image (); and wherein a contrast measurement unit () is configured to apply a local structure contrast measurement function to the structured pattern image () resulting in a structure contrast image (). The invention improves the scatter correction of an X-ray image.

Device and method for scatter correction in an x-ray image

An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.

Scatter correction for dark field imaging

The present invention relates to an apparatus () for feature suppression in dark field or phase contrast X-ray imaging. The apparatus comprises an input unit (), a processing unit () and an output unit (). The input unit is configured to provide the processing unit with an X-ray attenuation image of a region of interest of an object. The input unit is also configured to provide the processing unit with a dark field or phase contrast X-ray image of the region of interest of the object. The processing unit is further configured to identify a first feature in the X-ray attenuation image; to identify a second anatomical feature in the X-ray attenuation image; and to identify the second anatomical feature in the dark field or phase contrast X-ray image. The first feature is an obscuring anatomical feature depicted in the X-ray attenuation image with higher contrast than in the dark field or phase contrast X-ray image. The processing unit is also further configured to register the dark field or phase contrast X-ray image to the X-ray attenuation image based on the identified second anatomical feature. The processing unit is configured to determine a location of the first feature in the X-ray attenuation image; and to locate the first feature in the dark field or phase contrast X-ray image comprising utilization of information relating to the first feature identified in the X-ray attenuation image by transferring the determined location to the dark field or phase contrast X-ray image. The processing unit is still further configured to suppress the first feature in the dark field or phase contrast X-ray image to generate a feature suppressed dark field or phase contrast X-ray image. And the output unit is configured to output data representative of the feature suppressed dark field or phase contrast X-ray image.

Feature suppression in dark field or phase contrast X-ray imaging

An image processing apparatus (IP) comprising an input port (IN) for receiving projection data through respective 3D locations in an imaging region, said projection date collected in a scan operation by an imaging apparatus (IM). An image segment generator (IGS) of said apparatus (IP) is configured to generate, based on said projection data, a first image segment for said 3D locations. A visualizer (VIZ) configured to effect displaying said first image segment on a display device before or whilst the image apparatus collects projection data for a different 3D location.

Computing and displaying a synthetic mammogram during scanning acquisition

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Norderstedt, Germany

Hanns-Ingo Maack