Coupang, Corporation

Samsung Electronics Co., Ltd.

Lunit Inc.

Hanjun Lee

Minchul Kim

Yulhee Lee

Donggeun Yoo

Sanghyup Lee

Dukwon Nam

Hyun Bo Kang

Soung Hie Kim

Jeongho Pi

Kyoungwook Lee

Taeho Song

Sunggyun Park

Jiho Chang

Hansham Jeon

Hyojeong Lee

Sunggu Yu

Hyunsu Lim

Taenyun Kim

Seungjae Lee

Byungsoo Kim

Sangwan Nam

Suyong Kim

Suchang Jeon

A nonvolatile memory device includes a memory cell array to store an original setting data, a page buffer circuit connected to the memory cell array through a plurality of bit-lines, a secure buffer and a control circuit. The secure buffer includes an access control circuit and a plurality registers with restricted access, and the plurality registers store the original setting data that is dumped-down from the memory cell array through the page buffer circuit in an initialization sequence. The control circuit controls the page buffer circuit and the secure buffer. The plurality registers include a first register and second registers. The access control circuit, in response to the first register being accessed, accesses at least a portion of the second registers concurrently with accessing the first register.

Nonvolatile memory device and memory system

A method for determining an abnormality in a medical device from a medical image is provided. The method for determining an abnormality in a medical device comprises receiving a medical image, and detecting information on at least a part of a target medical device included in the received medical image.

Method and system for determining abnormality in medical device

A program method includes applying a first voltage to a plurality of bit lines, applying a second voltage to a common source line (CSL), and performing a program loop by applying a program voltage and a verify voltage to each of a plurality of ground selection lines (GSLs) positioned between one bit line among the plurality of bit lines and the CSL. The program loop is performed on both a program completed cell in which a program is completed by applying the program voltage and a program target cell.

Memory device and program method of ground select transistors

The present disclosure provides systems and methods for redelivering packages to customers, comprising a memory storing instructions and a processor configured to execute the instructions to receive, from a first user device, a notification of a delivery failure of a package, modify a database to assign the notification of the delivery failure and a cause for the delivery failure to the package identifier, modify the database to assign the package identifier to a group, among a plurality of groups, based on a delivery address associated with the package identifier, generate a map of the plurality of groups, and send the map for display on the user device. The map may comprise an activatable icon, and a location of the activatable icon on the map may be associated with the delivery address associated with the package identifier.

Computerized systems and methods for facilitating package redelivery

A computer-implemented system for correcting address information. The system may include a memory storing instructions and at least one processor configured to execute the instructions to perform operations. The operations may include requesting an address for normalization from at least one of a current address or a residential history of a user; receiving, from a user device, a user input including requested address information responsive to the request for normalization; searching, based on the user input, a cache to determine whether a refined version of the requested address is available; returning, based on a determination that a refined version of the requested address exists in the cache, a refined address as the normalized address to the user; and beginning to transport a package to the user at the normalized address, by providing instructions to a mobile device associated with a delivery worker, to transport the package to the normalized address.

Computerized systems and methods for address correction

Growing community of inventors

Seoul, South Korea

Hanjun Lee