Hi LLC

Han Yong Ban

Ryan Field

Michael Henninger

Isai Olvera

Alex Borisevich

Yaroslav Chekin

Joshua Schmidt

An illustrative optical measurement system may include a module comprising a light source configured to emit light directed at a target, a plurality of detectors configured to detect target photon arrival times of target photons of the light after the light is scattered by the target, and a reference detector configured to detect reference photon arrival times of reference photons of the light after the light is reflected within the module. The system may further include a controller configured to determine, based on an output from the reference detector, an instrument response function (IRF) of the module.

Instrument response function monitor on an optical measurement device

An illustrative optical measurement system includes a light source configured to emit light directed at a target. The system further includes a detector configured to detect arrival times for photons of the light after the light is scattered by the target. The system further includes a temperature sensor configured to output a temperature signal representative of a temperature of the light source. The system further includes an optical sensor configured to output a power signal representative of an optical power level of the light emitted by the light source. The system further includes a driver circuit configured to output, based on the temperature signal and the power signal, an input current for the light source.

Systems and methods for calibration of an optical measurement system

An illustrative optical measurement device includes a light source configured to emit light pulses directed at a target of a user. The optical measurement device further includes a detector configured to detect arrival times for photons of the light pulses after the photons are scattered by the target. The optical measurement device further includes a processing unit configured to determine, while the optical measurement device is being worn by the user, an instrument response function (IRF) associated with the optical measurement device. The processing unit is further configured to generate, based on the arrival times of the photons at the detector, histogram data associated with the target. The processing unit is further configured to determine, based on the IRF and the histogram data, a property of the target.

Devices, systems, and methods for calibrating an optical measurement device

An illustrative calibration member made from a material that scatters light may be used to perform a calibration operation with respect to an optical measurement device having a plurality of light sources and a plurality of detectors distributed among a plurality of modules. The calibration member may form an exterior surface configured to support the optical measurement device and scatter photons of light emitted by the optical measurement device. The calibration operation may be performed based on arrival times of the scattered photons detected by the optical measurement device.

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Han Yong Ban