Realtek Semiconductor Inc.

Han-Chieh Hsieh

Chao-Min Lai

Tang-Hung Chang

Chun-Yi Kuo

Hung-Wei Wang

Gerchih Chou

Cheng-Yu Tsai

Yu-Cheng Lo

Cheng-Chen Huang

Ping-Chia Wang

Shu-Yu Chang

Chih-Hsiung Hsu

Shih-Jung Hsu

Nan-chin Chuang

A current load circuit for testing a power supply circuit includes a control circuit and a load generation circuit. The control circuit is configured to generate a reset signal according to a clock signal. The load generation circuit is coupled to the control circuit and has several load configurations. The load generation circuit is configured to provide one of the load configurations as a current load of the load generation circuit according to the clock signal and the reset signal and receive a portion of the supply current provided by the power supply circuit according to the current load to generate an indication signal for indicating a performance of the power supply circuit.

Current load circuit and chip for testing power supply circuit

A package substrate and a chip package structure using the same are provided. The package substrate includes a laminated board including first to third wiring layers, a pad array, a plurality of ground conductive structures, and a plurality of power conductive structures. At least one of the ground (or power) conductive structures includes two first ground (or power) conductive posts and a second ground (or power) conductive post. The two first ground (or power) conductive posts and the second ground (or power) conductive post are arranged along a first direction, and the second ground (or power) conductive post is located between two orthographic projections of the two first ground (or power) conductive posts. Each of the ground conductive structures in a first column and each of the power conductive structures in a second column are offset from each other in a second direction.

Package substrate and chip package structure using the same

The present invention provides a processor including a core circuit, a plurality of clock signal generation circuits, a multiplexer and a detection circuit is disclosed. The core circuit is supplied by a supply voltage. The plurality of clock signal generation circuits are configured to generate a plurality of clock signals with different frequencies, respectively, wherein a number of the plurality of clock signals is equal to or greater than three. The multiplexer is configured to receive the plurality of clock signals, and to select one of the plurality of clock signals to serve as an output clock signal according to a control signal, wherein the core circuit uses the output clock signal to serve as an operating clock. The detection circuit is configured to detect a level of the supply voltage received by the core circuit in a real-time manner, to generate the control signal.

Processor with adjustable operating frequency

The present invention discloses an AVS scanning method, wherein the AVS scanning method includes the steps of: mounting a system on chip (SoC) on a printed circuit board (PCB), and connecting the SoC to a storage unit; enabling the SoC to read a boot code from the storage unit, and executing the boot code to perform an AVS scanning operation on the SoC to determine a plurality of target supply voltages respectively corresponding to a plurality of operating frequencies of the SoC to establish an AVS look-up table; and storing the AVS look-up table into the SoC or the storage unit.

Adaptive voltage scaling scanning method and associated electronic device

A frequency adjusting apparatus used in a processing chip operated at an operation frequency according to a power is provided that includes a clock supplying circuit, a frequency division circuit and a control circuit. The clock supplying circuit outputs one of clock signals as a supplied clock signal. The frequency division circuit performs frequency division on the supplied clock signal according to a parameter to generate an output clock signal. The control circuit determines a combination of a selected clock signal and a value of the parameter for gradually increasing the frequency of the output clock signal during the increasing of the voltage value that passes through voltage value sections, wherein when the voltage value is determined to be larger than a second threshold value and when the voltage value sections correspond to higher voltage values, the selected clock signal has a higher frequency.

Frequency adjusting apparatus and frequency adjusting method

A control device and a circuit board are provided. The control device can cooperate with the circuit board, and includes a ball grid array. The ball grid array includes a plurality of power balls and a plurality of ground balls, which are jointly arranged in a ball region. The power balls and the ground balls are respectively divided into a plurality of power ball groups and a plurality of ground ball groups. One of the ground ball groups includes two ground balls and is adjacent to a power ball group. A ball pitch between the two ground balls is greater than that between one of the power balls and one of the ground balls adjacent to each other. The circuit board includes a contact pad array corresponding to the ball grid array of the control device so that the control device can be disposed on the circuit board.

Control device and circuit board

Disclosed is an IC layout design method capable of improving a result of an integrated circuit (IC) layout design process including a front-end process and a back-end process. The IC layout design method includes the following steps: executing the front-end process according to an initial clock latency setting and thereby generating an initial netlist; executing at least a part of the back-end process according to the initial netlist and thereby obtaining an updated clock latency setting; executing at least a part of the front-end process according to the updated clock latency setting and thereby generating an updated netlist; and executing the back-end process according to the updated netlist and thereby obtaining the result of the IC layout design process.

Growing community of inventors

Hsinchu, Taiwan

Han-Chieh Hsieh