Microsanj, LLC

Creative Esp Incorporated

Hamid Reza Piroozi

Ali Shakouri

Dustin Kendig

James Christofferson

Stanley Yung-Ping Chien

Jie Chen

Ali Razban

Amin Amini

Mustafa Saad Abdulwahhab Kamoona

An infrared (IR) digital lens (IR Objective) for an optical microscope is disclosed which includes a body, configured to be mounted to an objective interface of an optical microscope, an IR camera disposed in the body, the IR camera configured to receive light in the range of IR and capture images from a specimen disposed under the body without the need to move the specimen from the optical microscope.

Microscope mounted infrared digital thermal image system

A method for providing a high spatial resolution thermal imaging of an active electronic device. The method includes placing an electronic device on a testing stage of an imaging system. The method, calibrating the imaging system by determining thermoreflectance coefficient for a plurality of pixels forming thermal images, each pixel having a coordinate (x,y) captured from the electronic device at each of a plurality of wavelengths of illumination (C(x,y,&#x3bb;), activating the electronic device, and determining changes in reflection for each of the plurality of pixels at each of the plurality of wavelengths (&#x394;R/R), determining &#x394;R/R vs. C(x,y,&#x3bb;) for each of the plurality of pixels for each of the plurality of wavelengths, fitting &#x394;R/R vs. C(x,y,&#x3bb;) to a predetermined mathematical function and use the parameters to calculate the temperature at each pixel.

Hyperspectral thermoreflectance imaging

A method for determining change in temperature of an electromagnetically radiating device between un-energized and energized states without contacting the device is disclosed. The method includes establishing a reference image form the device by illuminating the device with an optical signal having a first optical characteristic and capturing the reference image from the device in an un-energized state, establishing an on image form the device by illuminating the device in an energized state, and establishing a modified on image form the device by illuminating the device in the energized state with a modified optical signal having a third illuminating optical characteristic, and comparing the reference image, the on image, and the modified on image to establish changes in reflection as a result of changes in temperature of the device during energization.

Method and system for thermal imaging with optical emissions from a device under test

A system for managing performance of one or more electrical components in real-time includes one or more sensors to provide working conditions of one or more energy consuming devices. The system further includes one or more actuators coupled to and configured to control the one or more energy consuming devices. Additionally, the system includes a computing device in electrical communication with the one or more sensors and the one or more actuators. The system also includes a database capable of retaining an instruction program for the computing device. The computing device includes a processor that is configured to receive data from the one or more sensors, analyze data from the one or more sensors, and execute the instruction program received from the database in order to optimize operation of the one or more energy consuming devices based on one or more criteria.

System and method for managing electrical components for energy usage

A method for determining change in temperature of different parts of an electronic or optoelectronic device between un-energized and energized states without contacting the device. The method includes establishing a reference image form an unexcited device by illuminating the device with an optical signal and capturing the reference image from the device in an un-energized state, illuminating the device with an optical signal during an energization pulse having a predetermined pulse width and pulse magnitude and capturing a plurality of on images from the device at different time delays, determining a transient temperature profile, calibrating the temperature profile for one or more regions of the device with unknown thermoreflectance coefficient based on the determined transient temperature profile for the one or more regions of the device with known thermoreflectance coefficient.

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Fishers, IN, United States of America

Hamid Reza Piroozi