Applied Materials, Inc.

Adaptrum, Inc.

National Semiconductor Corporation

Siliconwaves Technologies Co. Ltd.

Hamid Aghajan

Ahmad Reza Bahai

Karim Nassiri Toussi

Haiyun Tang

Access to data representations of relatively dynamic actual usage and patterns of spectrum usage across channels, geographies (locations), and times can be advantageous in planning for resource utilization, and in structuring pricing for spectrum resources. Actual usage of spectrum resources can vary dynamically. Significant opportunities to advantageously utilize spectrum resources can be identified from relatively dynamic representations of actual usage.

Spectrum usage databases for cognitive radio

System and method for spectrum usage databases for cognitive radio

Apparatus and method for providing for packet data communication between a single-input-single-output (SISO) transceiver and a single-input-multiple-output/multiple-input-single-output (SIMO/MISO) transceiver. Receive channel coefficients representing relative strengths of individual signals received via multiple spatially diverse antenna elements and corresponding to a wireless data signal originating from a particular SISO radio frequency (RF) transceiver are used to provide substantially complementary transmit channel coefficients for use in producing outgoing RF signals to be transmitted via the same antenna elements for reception by such particular SISO RF transceiver.

SIMO/MISO transceiver for providing packet data communication with SISO transceiver

A method and associated apparatus for relating a test image with a reference image in an automated image processing system is disclosed. The test and reference images are aligned. A two-dimensional scatter plot is then created by plotting the gray level of a test image pixel against the gray level of a corresponding reference image pixel for each aligned pixel location.

Two-dimensional scatter plot technique for defect inspection

A two-dimensional scatter plot is created by plotting the gray levels of pixels from a test image against the gray levels of corresponding pixels from a reference image. A noise reduction filter is applied on the scatter plot to define a mask shape which can be extracted and filled-in to generate a mask. Defect pixels on the test image are identified by comparing corresponding pixel gray values against the mask. A typical application is detecting defects in a semiconductor wafer during device fabrication.

Growing community of inventors

Palo Alto, CA, United States of America

Hamid Aghajan