Samsung Electronics Co., Ltd.

Hak-soo Yu

Chul-woo Park

Hong-Sun Hwang

Uk-Song Kang

Jae-Youn Youn

Su-a Kim

Hyo-jin Choi

In-gyu Baek

Uk-Rae Cho

Nam-Seog Kim

Sua Kim

Young-Soo Sohn

Jong-Pil Son

Hoi-ju Chung

Jong-Cheol Lee

Joo-sun Choi

Mu-jin Seo

Kwang-il Park

Chulwoo Park

Sang-Bo Lee

Dong-Hyun Sohn

Jun-Jin Kong

Jung-Bae Lee

Hyun-Woo Chung

Young-Hyun Jun

Joo-Young Hwang

Kyomin Sohn

Kwan-Young Oh

Jung-Hyeon Kim

Hyang-Ja Yang

Jaeyoun Youn

Shinhaeng Kang

Seongil O

Sukhan Lee

Choong-Sun Shin

Sung Hyun Lee

Jun Hee Yoo

Namsung Kim

Hyoung-Joon Kim

Hyojin Choi

Young-Soo An

Young-Kug Moon

Jin-hyoung Kwon

Jong-Hak Won

In-Su Choi

Yuhwan Ro

Dongsoo Kang

Sung-Hyun Lee

Dong-Soo Kang

Hyunho Choi

Jinsu Jung

Jun-Hee Yoo

Hongsun Hwang

Kyoung-Heon Jeong

Hong-Sun Hwan

A memory device includes a processor in memory (PIM) circuit including an internal processor configured to perform an internal processing operation, and an interface circuit connected to the PIM circuit, wherein the interface circuit includes a command address decoder configured to decode a command and an address received through first pins to generate an internal command, a second pin configured to receive a voltage signal relating to a control of a PIM operation mode, and a command mode decoder configured to generate at least one command mode bit (CMB) based on the internal command and the voltage signal, and the interface circuit outputs internal control signals to the PIM circuit based on the at least one CMB to control the internal processing operation of the PIM circuit.

Memory device with internal processing interface

A memory device includes a memory cell array, signal lines, a mode selector circuit, a command converter circuit, and an internal processor. The memory cell array includes first and second memory regions. The mode selector circuit is configured to generate a processing mode selection signal for controlling the memory device to enter an internal processing mode based on the address received together with the command. The command converter circuit is configured to convert the received command into an internal processing operation command in response to activation of the internal processing mode selection signal. The internal processor is configured to perform an internal processing operation on the first memory region in response to the internal processing operation command, in the internal processing mode.

Method of performing internal processing operations with pre-defined protocol interface of memory device

A memory controller includes a controller input/output circuit configured to output a first command to read first data, and output a second command to read an error corrected portion of the first data. A memory device includes: an error detector, a data storage circuit and an error correction circuit. The error detector is configured to detect a number of error bits in data read from a memory cell in response to a first command. The data storage circuit is configured to store the read data if the detected number of error bits is greater than or equal to a first threshold value. The error correction circuit is configured to correct the stored data.

Semiconductor memory devices including error correction circuits and methods of operating the semiconductor memory devices

A semiconductor memory device may include a cell array comprising a plurality of memory cells, each memory cell connected to a word line and a bit line, the cell array divided into a plurality of blocks, each block including a plurality of word lines, the plurality of blocks including at least a first defective block; a nonvolatile storage circuit configured to store address information of the first defective block, and to output the address information to an external device; and a fuse circuit configured to cut off an activation of word lines of the first defective block.

Semicondutor memory device and memory system including the same

A test method of the semiconductor memory device including a memory cell array and an anti-fuse array includes detecting failed cells included in the memory cell array; determining a fail address corresponding to the detected failed cells; storing the determined fail address in a first region of the memory cell array; and reading the fail address stored in the first region to program the read fail address in the anti-fuse array. According to the test method of a semiconductor memory device and the semiconductor memory system, since the test operation can be performed without an additional memory for storing an address, the semiconductor memory device and the test circuit can be embodied by a small area.

Test method of semiconductor memory device and semiconductor memory system transferring fail address data from a volatile to a non-volatile memory array using an error-correction code engine

At least one refresh without scrubbing is performed on a corresponding portion of the memory device with a first frequency. In addition, at least one refresh with scrubbing is performed on a corresponding portion of the memory device with a second frequency less than the first frequency. Accordingly, refresh operations with data scrubbing are performed to prevent data error accumulation. Furthermore, refresh operations without data scrubbing are also performed to reduce undue power consumption from the data scrubbing.

Method and apparatus for refreshing and data scrubbing memory device

A memory module includes a plurality of memory devices and a buffer chip. The buffer chip manages the memory devices. The buffer chip includes a refresh control circuit that groups a plurality of memory cell rows of the memory devices into a plurality of groups according to a data retention time of tire memory cell rows. The buffer chip selectively refreshes each of the plurality of groups in each of a plurality of refresh time regions that are periodically repeated and applies respective refresh periods to the plurality of groups, respectively.

Memory modules and memory systems

A semiconductor memory device includes a control logic and a memory cell array in which a plurality of memory cells are arranged. The memory cell array includes a plurality of bank arrays, and each of the plurality of bank arrays includes a plurality of sub-arrays. The control logic controls an access to the memory cell array based on a command and an address signal. The control logic dynamically sets a keep-away zone that includes a plurality of memory cell rows which are deactivated based on a first word-line when the first word-line is enabled. The first word-line is coupled to a first memory cell row of a first sub-array of the plurality of sub-arrays. Therefore, increased timing parameters may be compensated, and parallelism may be increased.

Semiconductor memory devices and memory systems including the same

The semiconductor memory device includes a memory cell array and an error correction code (ECC) circuit. The memory cell array is divided into a first memory region and a second memory region. Each of the first and second memory regions includes a plurality of pages each page including a plurality of memory cells connected to a word line. The ECC circuit corrects single-bit errors of the first memory region using parity bits. The first memory region provides a consecutive address space to an external device by correcting the single-bit errors using the ECC circuit and the second memory region is reserved for repairing at least one of a first failed page of the first memory region or a second failed page of the second memory region.

In a method of refreshing in a memory device having a plurality of pages, a candidate refresh address corresponding to a page scheduled to be refreshed after a monitoring period is generated. Whether an active command is processed for the candidate refresh address is monitored during the monitoring period. If an active command is processed for the candidate refresh address during the monitoring period, the scheduled refresh for that page is skipped. If no active command is processed for the candidate refresh address during the monitoring period, the scheduled refresh operation is performed.

Memory device and method of refreshing in a memory device

In one example embodiment, a memory system includes a memory module and a memory controller. The memory module is configured generate density information of the memory module based on a number of the bad pages of the memory module, the bad pages being pages that have a fault. The memory controller is configured to map a continuous physical address to a dynamic random access memory (dram) address of the memory module based on the density information received from the memory module.

Memory system for continuously mapping addresses of a memory module having defective locations

A device includes a memory controller, a memory bus coupled to the memory controller, an internal memory and an external memory connection unit. The internal memory may be directly connected to the memory controller through the memory bus. The external memory connection unit may connect an external memory directly to the memory controller through a portion of signal lines in the memory bus, and may generate a flag signal indicating whether the external memory is connected to the external memory connection unit.

Device including an external memory connection unit capable of adopting an external memory

A semiconductor memory device includes a memory cell array and a control logic. The memory cell array includes first and second sub arrays, the first sub array includes a first set of bank arrays, and the second sub array includes a second set of bank arrays. Each of the upper and lower bank arrays includes first and second portions having different timing parameters with respect to each other. The control logic controls access to the first and second portions such that read/write operation is performed on the first and second portions.

Semiconductor memory device and memory system including the same

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Seongnam-si, South Korea

Hak-soo Yu