Sony Corporation

Cemedine Co., Ltd.

Hajime Yagi

Hideo Yamanaka

Hisayoshi Yamoto

Tadaharu Tsuyuki

Yuichi Satou

Yuichi Sato

Yuuichi Sato

Takashi Noguchi

Yasuhiro Kanaya

Hiroshi Aoki

Naomi Okamura

Koji Hirano

Tatsushiro Hirata

Yoshihiro Miyazawa

Toshiro Kobayashi

Tsutomu Mori

Takashi Yamanaka

Hideo Nagasaki

Nobuo Hagiwara

Kotaro Koma

Yoshihiro Saito

Yasuo Arai

Junzo Makino

A numerical-simulation-result display system includes an image output apparatus, a three-dimensional-CAD-model-data input unit configured to read three-dimensional-CAD-model data of an object to be analyzed, a CAD-model-data converting unit configured to convert the read three-dimensional-CAD-model data into CAD graphic data capable of being displayed on the image output apparatus, a numerical-simulation-result-data input unit configured to read numerical-simulation-result data of the object, a simulation-result converting unit configured to convert the read numerical-simulation-result data into simulation-result graphic data capable of being displayed on the image output apparatus, and a display unit configured to display the CAD graphic data and the simulation-result graphic data on the image output apparatus in a superimposed manner.

Numerical-simulation-result display program, numerical-simulation-result display method, and numerical-simulation-result display system

A deposition mask with which position precision of a passage hole is improved and deposition can be conducted precisely and a manufacturing method thereof are provided. A mask body made of a metal thin film is fixed and tightly mounted on a frame body having an opening. The mask body has at least one pattern region including a plurality of passage holes for letting through a deposition material, a stress relaxation region including a plurality of fine holes provided at the periphery of the pattern region, and a holding region provided at the periphery of the stress relaxation region. The mask body is tightly mounted on the frame body at a holding region.

Deposition mask and manufacturing method thereof

Each of an electrooptical device and a driving substrate for the electrooptical device includes a first substrate having a display section provided with pixel electrodes and a peripheral-driving-circuit section provided on the periphery of the display section, a second substrate, and an optical material disposed between the first substrate and the second substrate. A gate section including a gate electrode and a gate-insulating film is formed on one surface of the first substrate, a compound layer having high lattice matching with single-crystal silicon is formed on the surface of the first substrate, and a single-crystal silicon layer is formed on the first substrate including the compound layer and the gate section. The single-crystal silicon layer constitutes a channel region, a source region, and a drain region. In addition, a first bottom-gate thin-film transistor having the gate section is formed below the channel region, the first bottom-gate thin-film transistor constituting at least a part of the peripheral-driving-circuit section.

Electrooptical device, substrate for driving electrooptical device and methods for making the same

A single crystal silicon is graphoepitaxially grown using a step formed on a substrate as a seed by a catalyst process, and the obtained single crystal silicon layer is used for a dual gate type MOSTFT in an electro-optical apparatus such as a display section of a peripheral driving circuit integration type LCD. A single crystal silicon thin film having high electron/hole mobility is formed into a uniform film at a relatively low temperature, which enables the manufacturing of an active matrix substrate incorporated with a high-performance driver which can be used in a TFT display.

Electro-optical apparatus, driving substrate for an electro-optical apparatus and method of manufacturing them

A single-crystal silicon layer is formed by graphoepitaxy from a low-melting-point metal layer which contains dissolved polycrystalline or amorphous silicon, or from a melt of a silicon-containing low-melting-point metal, using step differences formed on a substrate as a seed for the epitaxial growth. This single-crystal silicon layer is used as dual-gate MOSTFTs, or bottom-gate MOSTFTs, of an electrooptical device such as an LCD integrating a display section and a peripheral-driving-circuit section. This process enables production of a uniform single-crystal silicon thin-film having high electron/hole mobility at a relatively low temperature. The display section includes LDD-nMOSTFTs or pMOSTFTs having high switching characteristics and a low leakage current. The peripheral-driving-circuit section includes cMOSTFTs, nMOSTFTs, pMOSTFTs, or a combination thereof, having high driving ability.

Method of producing electrooptical device and method of producing driving substrate for driving electrooptical device

A method for forming a semiconductor film capable allowing easy cleaning of the processing equipment and capable of forming an epitaxial film at low temperatures as well as a manufacturing method for semiconductor devices utilizing this forming method is needed for achieving selective crystalline growth on semiconductor film. The forming method comprises a process for forming a mask having an aperture exposing a substrate surface on substrate, and a process for forming a semiconductor film by selective crystalline growth on a semiconductor piece by means of catalytic chemical vapor deposition on a substrate surface exposed by an aperture on a mask; as well as a manufacturing method for semiconductor devices utilizing the semiconductor film forming method.

Semiconductor film forming method and manufacturing method for semiconductor devices thereof

An electro-optic device, such as an LCD, includes a display unit and a peripheral drive circuit unit on a single substrate. A gate comprising a gate electrode and gate insulation film is formed on a surface of the substrate. A layer of a substance having good lattice compatibility with manocrystalline silicon is formed over the gate insulation film. A layer of monocrystalline silicon is formed over the substance layer. Manocrystalline silicon is heteroepitaxially grown by catalytic CVD or the like using a crystalline sapphire film formed on the substrate to form the monocrystalline silicon layer. The monocrystalline silican layer is used as a dual gate MOSTFT of the electro-optic device.

Electro-optic device, drive substrate for electro-optic device and method of manufacturing the same

Electro-optical apparatus having a display section and a peripheral driving circuit section

A single-crystal silicon layer is formed by graphoepitaxy from a low-melting-point metal layer which contains dissolved polycrystalline or amorphous silicon, or from a melt of a silicon-containing low-melting-point metal, using step differences formed on a substrate as a seed for the epitaxial growth. This single-crystal silicon layer is used as dual-gate MOSTFTS, or bottom-gate MOSTFTS, of an electrooptical device such as an LCD integrating a display section and a peripheral-driving-circuit section. This process enables production of a uniform single-crystal silicon thin-film having high electron/hole mobility at a relatively low temperature. The display section includes LDD-nMOSTFTs or pMOSTFTs having high switching characteristics and a low leakage current. The peripheral-driving-circuit section includes cMOSTFTs, nMOSTFTs, pMOSTFTs, or a combination thereof, having high driving ability.

Single-crystal silicon is deposited on an insulating substrate ( ) with a crystalline sapphire layer ( ) formed thereon as a seed, to form a silicon epitaxial layer ( ). P-type impurity ions are implanted into a single-crystal silicon layer, and then N-type impurity ions are implanted to make a P-channel MOS transistor portion a single-crystal silicon layer ( ). In a single-crystal silicon layer ( ), an N source region ( ) and drain region ( ) of an N-channel MOS transistor are formed. Thus, a silicon layer is epitaxially grown uniformly at low temperatures.

Method of forming monocrystalline silicon layer, method for manufacturing semiconductor device, and semiconductor device

Polycrystalline silicon film forming methods to improve movement of electrons and holes and thus allow the fabrication of high performance semiconductor elements is needed. In a method of the present invention, polycrystalline is formed utilizing as a material, a chemical compound comprising at least one type of impurity from among tin (Sn), germanium (Ge) and lead (Pb) and a polycrystalline silicon film doped with impurities from at least one type from among tin (Sn), germanium (Ge) and lead (Pb) thus formed. In another method, polycrystalline silicon is formed, and the polycrystalline silicon film thus obtained is afterwards then doped with an impurity consisting of at least one type from among tin (Sn), germanium (Ge) and lead (Pb).

Methods for forming polycrystalline silicon film

The present invention provides an active matrix substrate having a built-in high-performance driver, in which a single crystal silicon thin film having high electron/hole mobility is uniformly deposited at a relatively low temperature, and an electrooptic device such as a thin film semiconductor device for display including the active matrix substrate. The single crystal silicon thin film is deposited by hetero epitaxial growth by a catalytic CVD method or the like using a crystalline sapphire thin film formed on the substrate as a seed so that the single crystal silicon layer obtained is used for top gate type MOSTFTs of the electrooptic device such as a LED or the like in which a display region and a peripheral driving circuit region are integrated.

Electrooptic device, driving substrate for electrooptic device, and method of manufacturing the device and substrate

An electro-optic device, such as an LCD, includes a display unit and a peripheral drive circuit unit on a single substrate. A gate comprising a gate electrode and gate insulation film is formed on a surface of the substrate. A layer of a substance having good lattice compatibility with monocrystalline silicon is formed over the gate insulation film. A layer of monocrystalline silicon is formed over the substance layer. Monocrystalline silicon is heteroepitaxially grown by catalytic CVD or the like using a crystalline sapphire film formed on the substrate to form the monocrystalline silicon layer. The monocrystalline silicon layer is used as a dual gate MOSTFT of the electro-optic device.

A single crystal silicon thin film having a high electron/hole mobility is uniformly formed at a relatively low temperature, so that production of an active matrix substrate having a built-in high performance driver and an electrooptical apparatus, such as a thin film semiconductor apparatus for display, becomes possible. A single crystal silicon layer is formed by hetero-epitaxial growth from a molten liquid layer of a low melting point metal having silicon dissolved therein by using a crystalline sapphire film formed on a substrate as a seed, and the single crystal silicon layer is used in a top gate type MOS TFT of an electrooptical apparatus, such as an LCD, in which a display part and a peripheral driving circuit are integrated.

Growing community of inventors

Tokyo, Japan

Hajime Yagi