Hoya Corporation

Rflocus Inc.

Mighty Card Corporation

Mighty Cube Co., Ltd.

Hajime Kamiya

Hitoshi Kamura

Masaaki Yoshihara

Masahisa Kosaka

Tokio Suzuki

Tetsuo Ohsora

Kimio Nakamura

Koji Sato

A position detection systemidentifies position information on the basis of a position signal received from a storage mediumP disposed in a placement area where a target item is placed, identifies item information on the basis of an item signal received from a storage mediumQ attached to the target item, and associates the position information with the item information and stores the associated information when the item signal is received during a period of time that starts from a time at which the position information is identified and that does not exceed a predetermined length of time.

Position detection system

A storage medium-compatible communications unit, a phase detection unit, a parameter acquisition section and a location detection section are provided. The storage medium-compatible communications unit communicates with a storage medium by wireless using electromagnetic waves at a predetermined frequency. The phase detection unit detects phases of signals received from the storage medium. The parameter acquisition section acquires a distance detection parameter to be used in detecting a storage medium distance from a first position of an antenna to the storage medium. The first position is a position in a range of positions of the antenna from which the distance to the storage medium is shortest. The distance detection parameter is a value set in accordance with a positional relationship between the first position and a second position. The second position is a position of the antenna in the range of positions of the antenna that is different from the first position. The location detection section detects the storage medium distance, using a first phase detected by the phase detection unit at the first position, a second phase detected by the phase detection unit at the second position, and the distance detection parameter acquired by the parameter acquisition section. The location detection section identifies the first position at a time at which a trend of changes of phase detected by the phase detection unit in association with movement of the antenna reverses.

Storage medium location detection system and program

Provided are an RFID tag movement distinguishing method and an RFID tag movement distinguishing program with which are an RFID tag that has moved in front of an antenna and an RFID tag that is static are identified. Chronological read data of RFID tags including a moving RFID tag and a static RFID tag is acquired by an RFID reader, and the static RFID tag is specified by a static RFID tag filter based on information of read RFID tags. In the RFID tag movement distinguishing method, the static RFID tag filter identifies the moving RFID tag by identifying the static RFID tag and the moving RFID tag using an individual static RFID tag filter among a quick-read filter, an RSSI absolute value filter, an RSSI non-contiguous increase filter, an RSSI valley-shaped filter, an excess read filter, a phase shift reduction filter, and a vertical direction movement filter.

RFID tag movement distinguishing method and RFID tag movement distinguishing program

A substrate holder (,) on which a plurality of optical lens base materials (,) are arranged is installed to be rotatable in a vacuum atmosphere and a vacuum processing chamber (,) for forming water repellent films on the surfaces of the optical lens base materials, and further a both sides simultaneous water repellency processing mechanism is installed in this vacuum processing chamber. In regard to the substrate holder (,), an upper side water repellency processing unit (,) and a lower side water repellency processing unit (,) are provided, and the upper side water repellency processing unit forms the water repellent film on the upper side of the optical lens base material, while the lower side water repellency processing unit forms the water repellent film on the lower side of the optical lens base material. This configuration forms the water repellent films simultaneously onto the both sides of the optical lens base material. A film thickness correcting mechanism for the water repellency processing is composed of a film thickness correcting plate (,) for correcting a film thickness difference, which is arranged between the water repellency processing unit and the optical lens base material.

Mechanism for performing water repellency processing on both sides simultaneously

Plastic optical devices in which an antireflection film (,) is coated on the surface of a plastic base material (,). The antireflection film (,) is a multi-layered film which is formed by depositing a first layer (,) on the side of the plastic base material substantially by a high-refractive material and the next layer (,) by a low-refractive material, and by alternately laminating those high-refractive materials and low-refractive materials. The surface of the optical lens base material (,) has curvature and a plurality of the optical lens base materials (,) are disposed horizontally at the positions of concentric circles in a circular plate holder (,) which is placed horizontally and is rotatable. A sputtering film deposition system comprises targets (,) facing to the surfaces of the optical lens base materials (,). Thickness correcting plates function as mask members (,) for regulating the difference of film thickness disposed in the direction connecting the peripheral part and the center part in the holder and between the targets (,) and the holder (,).

Plastic optical devices having antireflection film and mechanism for equalizing thickness of antireflection film

Antireflection films are coated on the both sides of an optical lens by sputtering in a sputtering system. In a vacuum processing chamber (,) for performing the sputtering, a plurality of optical lens base materials are placed transversely on a substrate holder (,). The holder (,) is set rotatably in a vacuum atmosphere. The optical lens base materials are embedded to holes (,) formed in the holder (,), facing their concave surface up, by using ring-shaped holding tools (,). The height of the ring-shaped holding tool (,) is larger than the height of the edge of the optical lens base material (,) within the limits of 2 mm when the thickness of the lens edge of the optical lens base material is large. Part of the ring-shaped holding tool (,) which is put together with the upper surface of the optical lens base material (,) is tapered when the thickness of the lens edge of the optical lens base material is small.

Mechanism for setting optical lens base material on holder

The anti-reflection optical element of the present invention achieves reduction of surface reflection by providing a multi-layered anti-reflection film directly or indirectly on an optical component made of a plastic. The anti-reflection optical element of the present invention uses a multi-layered anti-reflection film comprising at least one high refractive index film layer which is a film of mixed metal oxides comprising tantalum oxide, zirconium oxide and yttrium oxide deposited by evaporation process, and thereby has solved the problems of conventional anti-reflection optical elements that their optical, mechanical and chemical properties are deteriorated with the lapse of time.

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Tokyo, Japan

Hajime Kamiya