Kla Tencor Corporation

Haiyang You

Lu Yu

Jianou Shi

Fan Zhang

Nanchang Zhu

Walter H Johnson, Iii

Xianghua Liu

Jianli Cui

Zhuoxian Zhang

Zhu-bin Shi

Resistivity probes can be used to test integrated circuits. In one example, a resistivity probe has a substrate with multiple vias and multiple metal pins. Each of the metal pins is disposed in one of the vias. The metal pins extend out of the substrate. Interconnects provide an electrical connection to the metal pins. In another example, a resistivity probe has a substrate with a top surface and multiple elements extending from the substrate. Each of the elements curves from the substrate to a tip of the element such that each of the elements is non-parallel to the top surface of the substrate.

Resistivity probes with curved portions

Resistivity probe having movable needle bodies

Growing community of inventors

Shanghai, China

Haiyang You