Koninklijke Philips Corporation N.v.

Haiko Klepzig

Ewald Bergler

Josef Preishuber-Pfluegl

Reinhard Fetzer

An integrated circuit ( ) has a semiconductor die ( ) and an integrated circuit configuration ( ) realized on the semiconductor die ( ) and situated within bounding faces ( ) of the semiconductor die ( ), in which two conductor track sections ( ) have been provided, which issue from the integrated circuit configuration ( ) and which each extend up to a bounding face ( ) and which are required for the application of a useful signal (BR ) utilized for test purposes during the fabrication of the integrated circuit ( ), and in which an additional conductor track section ( ) has been provided, which is disposed adjacent the two conductor track sections ( ) and which issues from the integrated circuit configuration ( ) and extends toward a bounding surface ( ) and preferably up to this bounding face ( ) and which serves for the application of a spurious signal (BR ) which interferes with testing.

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Hamburg, Germany

Haiko Klepzig