Boe Technology Group Co., Ltd.

Hefei Boe Optoelectronics Technology Co., Ltd.

Beijing Didi Infinity Technology and Development Co., Ltd.

Chengdu Boe Optoelectronics Technology Co., Ltd.

Kempur Microelectronics, Inc.

Haibo Li

Yangkun Jing

Xiaopan Che

Jia Ding

Jian Qiao Sun

Wei He

Xin Chen

Bing Li

Yu Zhao

Yanxia Xin

Qun Ma

Xiaoyan Yang

Xiaoyun Wang

Xiping Li

Xueping Li

Jia Sun

Yihao Wu

Cheng Tan

Hui Qiu

Weimin Wu

Jianpeng Liu

Gui Li

Junwei Xia

Yong Zhuo

Yuhao Qin

Roger Sinta

Cuimei Diao

Xiantao Han

Menghua Jiang

Kui Fang

The present application provides a displaying base plate and a displaying device, which relates to the technical field of displaying. The displaying device can ameliorate the problem of screen greening caused by electrostatic charges, thereby improving the effect of displaying. The displaying base plate includes an active area and a non-active area connected to the active area, the non-active area includes an edge region and a first-dam region, and the first-dam region is located between the active area and the edge region; the displaying base plate further includes: a substrate; an anti-static layer disposed on the substrate, wherein the anti-static layer is located at least within the edge region; and a driving unit and a touch unit that are disposed on the substrate, wherein the driving unit is located within the active area.

Display substrate and display apparatus

The present disclosure relates to systems and methods for providing a reliability of passing time for a path in route planning. The methods may include obtaining a route planning request from a user terminal; determining a plurality of candidate paths; determining a first estimated travel time cost and a first variance for each link of a target candidate path; determining a second estimated travel time cost for the target candidate path based on the first estimated travel time cost of each link; determining a second variance for the target candidate path based on the first variance associated with each link of the target candidate path; determining a reliability of passing time for the target candidate path based on the second estimated travel time cost and the second variance; and directing the user terminal to display the target candidate path with the reliability of passing time.

Systems and methods for providing a reliability of passing time for a path in route planning

A method for speed prediction may include obtaining current vehicle speeds associated with first vehicles that pass through a target road section in a current time interval. The method may also include determining a current road speed associated with the target road section in the current time interval based on the current vehicle speeds. The method may also include determining a predicted speed difference between the current road speed and a future road speed associated with the target road section in a future time interval based on the current road speed and a trained prediction model, which is based on prior speed differences, wherein the current time interval and the future time interval are separated by a first time period. The method may also include estimating the future road speed based on the predicted speed difference and the current road speed.

Systems and methods for speed prediction

The present disclosure provides a monitoring device, a monitoring method and a device for cutting a display substrate. The monitoring device includes an infrared temperature detection module configured to detect a temperature at a contacting position where a cutter wheel is in contact with the display substrate when cutting the display substrate with the cutter wheel, so as to acquire a temperature parameter at the contacting position; and a processing module configured to generate, based on the temperature parameter, a corresponding control parameter for controlling the process of cutting the display substrate.

Monitoring device, monitoring method, and device for cutting and grinding display substrate

The present disclosure provides a method and a device of inspecting a sealant coating on a substrate. An image of a sample substrate is captured. The sample substrate is selected from a plurality of substrates. A non-coating area is identified from the image of the sample substrate. Abnormal points are identified in the non-coating area. Positions of the abnormal points are recorded. An image of a sealant-coated substrate having a sealant coating on one of the plurality of substrates is captured. Defect positions of the sealant coating are identified from the image of the sealant-coated substrate. Defects located in a non-coating area of the sealant-coated substrate at positions corresponding to the positions of the abnormal points identified based on the sample substrate are considered as normal.

Method and device for sealant coating inspection

Provided are a novel negative chemically-amplified photoresist and an imaging method thereof. The negative chemically-amplified photoresist comprises phenol resin, a photo-acid generator, a cross-linking agent, an alkaline additive, a sensitizing agent and a photoresist solvent, wherein the phenol resin is a host material of the novel negative chemically-amplified photoresist; the photo-acid generator is capable of generating an acid with a certain strength under illumination; and the cross-linking agent can undergo a condensation reaction with a phenolic hydroxyl group or an ortho-/para-hydroxymethyl functional group. The imaging method of the novel negative chemically-amplified photoresist comprises coating, baking, exposure, baking, developing and other steps. The chemically-amplified negative photoresist of the present invention can improve the resolution and photospeed of photoresists effectively. And meanwhile, the chemically-amplified negative photoresist, for which the ancillaries used is the same as that used for positive photoresists, is applicable in the fields of manufacture of top-grade integrated circuits, flat panel displays and LED chips.

Negative chemically-amplified photoresist and imaging method thereof

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Beijing, China

Haibo Li