Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Haesung Kim

Hyunjoon Kim

Jeongyub Lee

Bonwon Koo

Eunhyoung Cho

Kyu Wook Choi

Choonggil Lim

Jun Ho Jang

Sangkeun Lee

Jungyun Won

Youngchul Leem

Kwang-su Lee

An optical device forms a refractive index distribution for exhibiting a certain phase delay profile with respect to light in a visible light wavelength, and includes a nanopattern layer including a crystalline compound having a refractive index greater than 3 with respect to the light in the visible light wavelength band and a height equal to or less than 2 μm. The nanopattern layer may include the crystalline compound grown according to a selective epitaxial growth method, and accordingly, may have a height beneficial for a manufacturing process. Thus, the efficiency of the optical device may be improved.

Optical device and method of manufacturing the same

An inspection apparatus includes: a plurality of support members that support a display panel at a predetermined height; a bending-pressing member that presses a pressing surface of the display panel; a sound wave sensor that senses a sound wave generated from the display panel during a bending inspection process, wherein during the bending inspection process, the bending-pressing member presses the pressing surface of the display panel; and an inspection controller that detects a crack in the display panel using the sound wave sensed by the sound wave sensor.

Inspection apparatus and method of driving the same

Provided are a pattern structure for preventing a moir&#xe9; pattern from becoming visible, and a display apparatus using the same. The pattern structure includes a first element pattern including a plurality of first elements arranged regularly at a first pitch; a second element pattern including a plurality of second elements arranged regularly at a second pitch, the second element pattern being provided on the first element pattern; and a filling layer configured to fill gaps among the plurality of second elements, between adjacent ones thereof. A difference between transmittances of the second element and the filling layer is about 5% or less and thus, a moir&#xe9; pattern occurring due to the overlapping of the first element pattern and the second element pattern may be prevented from becoming visible.

Pattern structure for preventing visibility of moir&#xe9; and display apparatus using the pattern structure

Growing community of inventors

Hwaseong-si, South Korea

Haesung Kim