Advanced Semiconductor Materials Fico Tooling, B.v.

H E Dijkmeijer

Ireneus J Pas

An apparatus and method for handling a workpiece includes the combination of a first workpiece position for checking the presence of a workpiece and a second subsequent position for checking the orientation of a workpiece. An orientation device adjacent the orientation checking position orients the workpiece to a proper position for subsequent transportation to a third workpiece position such that acceptable workpieces may be segregatably removed to a subsequent handling location.

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Kropwolde, Netherlands

H E Dijkmeijer