Sandisk Technologies Inc.

University of Minnesota

Gyusung Park

Xiaofeng Zhang

Steve Choi

Hyung-il Kim

In some examples, a device includes an analog-to-digital converter (ADC) configured to receive an analog signal and output digital codes based on values of the analog signal. The device also includes a plurality of counters, where each counter of the plurality of counters is configured to increment in response to a respective digital code outputted by the ADC.

Testing an analog-to-digital converter using counters

Apparatuses and techniques are described for calibrating a negative voltage source. A ground voltage is applied to a multi-stage amplifier from the negative voltage source while an offset voltage measurement (OVM) is made at the output of the multi-stage amplifier. The OVM is recorded and subsequently used by a calibration circuit when the negative voltage source applies a range of negative voltages to the input of the multiple stage amplifier. The calibration circuit subtracts the OVM from measurements obtained at the output of the multi-stage amplifier to obtain corrected measurements, and uses the corrected measurements to calibrate the negative voltage source, e.g., by adjusting a relationship between digital values input to the negative voltage source and the output voltages.

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Saint Paul, MN, United States of America

Gyusung Park