Growing community of inventors

Kanagawa, Japan

Gyokubu Cho

Average Co-Inventor Count = 3.66

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 16

Gyokubu ChoKoichi Komatsu (6 patents)Gyokubu ChoHidemitsu Asano (5 patents)Gyokubu ChoAkira Takada (4 patents)Gyokubu ChoMasato Kon (4 patents)Gyokubu ChoHiraku Ishiyama (4 patents)Gyokubu ChoTakuho Maeda (3 patents)Gyokubu ChoTakashi Hanamura (3 patents)Gyokubu ChoHiroyuki Yoshida (2 patents)Gyokubu ChoTatsuya Nagahama (2 patents)Gyokubu ChoKozo Ariga (2 patents)Gyokubu ChoMakoto Kaieda (2 patents)Gyokubu ChoIsao Tokuhara (2 patents)Gyokubu ChoKenji Okabe (1 patent)Gyokubu ChoHiroshi Sakai (1 patent)Gyokubu ChoDahai Yu (1 patent)Gyokubu ChoYutaka Watanabe (1 patent)Gyokubu ChoBarry Saylor (1 patent)Gyokubu ChoRyan Northrup (1 patent)Gyokubu ChoKazuki Kitagawa (1 patent)Gyokubu ChoTakahisa Ootake (1 patent)Gyokubu ChoGyokubu Cho (15 patents)Koichi KomatsuKoichi Komatsu (16 patents)Hidemitsu AsanoHidemitsu Asano (18 patents)Akira TakadaAkira Takada (25 patents)Masato KonMasato Kon (15 patents)Hiraku IshiyamaHiraku Ishiyama (7 patents)Takuho MaedaTakuho Maeda (4 patents)Takashi HanamuraTakashi Hanamura (4 patents)Hiroyuki YoshidaHiroyuki Yoshida (39 patents)Tatsuya NagahamaTatsuya Nagahama (29 patents)Kozo ArigaKozo Ariga (13 patents)Makoto KaiedaMakoto Kaieda (6 patents)Isao TokuharaIsao Tokuhara (2 patents)Kenji OkabeKenji Okabe (24 patents)Hiroshi SakaiHiroshi Sakai (21 patents)Dahai YuDahai Yu (17 patents)Yutaka WatanabeYutaka Watanabe (13 patents)Barry SaylorBarry Saylor (10 patents)Ryan NorthrupRyan Northrup (7 patents)Kazuki KitagawaKazuki Kitagawa (4 patents)Takahisa OotakeTakahisa Ootake (3 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Mitutoyo Corporation (15 from 1,623 patents)


15 patents:

1. 12210722 - Position specifying method and program

2. 11656733 - Position specifying method and program

3. 11314374 - Position specifying method and program

4. 11257205 - Image measuring method and apparatus

5. 11215788 - Variable focal length lens device and variable focal length lens control method

6. 11037337 - Method and apparatus for generating measurement plan for measuring X-ray CT

7. 10753887 - X-ray CT measuring apparatus and interference prevention method thereof

8. 10656780 - Position specifying method and program

9. 10642017 - Imaging system and imaging method

10. 10618220 - Object-forming machine, cross-section measurement apparatus, and cross-section measurement method

11. 10343334 - Object-forming machine, cross-section measurement apparatus, and cross-section measurement method

12. 10102631 - Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program

13. 10027885 - Image measuring apparatus

14. 9726473 - Light interference measuring device and program therefor

15. 8957960 - Machine vision system program editing environment including real time context generation features

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