Growing community of inventors

Niskayuna, NY, United States of America

Gyeong Woo Cheon

Average Co-Inventor Count = 5.36

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 4

Gyeong Woo CheonBernard Patrick Bewlay (3 patents)Gyeong Woo CheonHuan Tan (3 patents)Gyeong Woo CheonGuanghua Wang (3 patents)Gyeong Woo CheonBrandon Stephen Good (3 patents)Gyeong Woo CheonLi Zhang (3 patents)Gyeong Woo CheonAlberto Santamaria-Pang (3 patents)Gyeong Woo CheonBijan Chitsaz (3 patents)Gyeong Woo CheonJilin Tu (2 patents)Gyeong Woo CheonArpit Jain (1 patent)Gyeong Woo CheonYounkoo Jeong (1 patent)Gyeong Woo CheonGhulam Ali Baloch (1 patent)Gyeong Woo CheonWeina Ge (1 patent)Gyeong Woo CheonIsabella Heukensfeldt Jansen (1 patent)Gyeong Woo CheonGyeong Woo Cheon (6 patents)Bernard Patrick BewlayBernard Patrick Bewlay (202 patents)Huan TanHuan Tan (45 patents)Guanghua WangGuanghua Wang (39 patents)Brandon Stephen GoodBrandon Stephen Good (28 patents)Li ZhangLi Zhang (26 patents)Alberto Santamaria-PangAlberto Santamaria-Pang (21 patents)Bijan ChitsazBijan Chitsaz (3 patents)Jilin TuJilin Tu (16 patents)Arpit JainArpit Jain (25 patents)Younkoo JeongYounkoo Jeong (19 patents)Ghulam Ali BalochGhulam Ali Baloch (14 patents)Weina GeWeina Ge (5 patents)Isabella Heukensfeldt JansenIsabella Heukensfeldt Jansen (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. General Electric Company (6 from 51,873 patents)


6 patents:

1. 12422331 - Methods and apparatus to autonomously detect thermal anomalies

2. 11971329 - Methods and apparatus to autonomously detect thermal anomalies

3. 11657506 - Systems and methods for autonomous robot navigation

4. 11643943 - Gimbal systems, apparatus, articles of manufacture and associated methods

5. 10970586 - Systems and methods of 3D scene segmentation and matching for robotic operations

6. 10937150 - Systems and methods of feature correspondence analysis

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