Yonsei University

Lg Display Co., Ltd.

GwangMook Kim

WooYoung Shim

Sungpil Ryu

Kiseok Chang

HanSaem Kang

JaeMin Myoung

SungJun Cho

WookSung Kim

Provided is a scanning probe microscope, and in particular, a scanning probe microscope capable of scanning a large area using a probe including a plurality of conductive tips and capable of simply generating a surface image of a sample with high resolution by recognizing only two binary states of contact/non-contact between the conductive tips and a surface of the sample.

Probe for scanning probe microscope and binary state scanning probe microscope including the same

The present disclosure relates to a contact sensitive device and a contact sensitive device according to an exemplary embodiment of the present disclosure includes a base film, a first electrode, a second electrode, a third electrode, and a thermochromic layer. A protruding pattern is disposed on the base film. The first electrode and the second electrode are disposed on the base film and are spaced apart from each other with the protruding pattern therebetween. The third electrode is in contact with the protruding pattern. The thermochromic layer is disposed on the third electrode.

Contact sensitive device

Growing community of inventors

Seoul, South Korea

GwangMook Kim