Synopsys, Inc.

Guy Maor

Jiayong Le

Mustafa Celik

Ayhan Mutlu

Yuji Kukimoto

Haobin Li

Chih-Wei Jim Chang

Chin-Wei Jim Chang

The invention provides a method for performing statistical static timing analysis using a novel on-chip variation model, referred to as Sensitivity-based Complex Statistical On-Chip Variation (SCS-OCV). SCS-OCV introduces complex variation concept to resolve the blocking technical issue of combining local random variations, enabling accurate calculation of statistical variations with correlations, such as common-path pessimism removal (CPPR). SCS-OCV proposes practical statistical min/max operations for random variations that can guarantee pessimism at nominal and targeted N-sigma corner, and extends the method to handle complex variations, enabling graph-based full arrival/required time propagation under variable compaction. SCS-OCV provides a statistical corner evaluation method for complex random variables that can transform vector-based parametric timing information to the single-value corner-based timing report, and based on the method derives equations to bridge POCV/SSTA with LOCV. This significantly reduces the learning curve and increases the usage of the technology, being more easily adopted by the industry.

Statistical corner evaluation for complex on-chip variation model

The invention provides a method and system for performing Static Timing Analysis on SoC (System on a Chip) designs. The invention solves a longstanding problem with timing analysis of designs, namely, the ability to multi-thread the design under analysis. The invention provides for slicing a design into levels, further decomposing each level into gates, and the multi-threaded processing of gates so that the solution of large design analysis is generated significantly faster than current approaches. Further, the invention provides that only one level exists in the RAM at any time. Once the arrival time on the level is computed, the data is saved to disk immediately. Because the memory footprint is sub-linear to the size of the design, entire system-on-a chip designs may be run on inexpensive, off-the-shelf hardware.

Method and system for high speed and low memory footprint static timing analysis

Statistical corner evaluation for complex on chip variation model

The invention provides a method and system for performing Static Timing Analysis on SoC (System on a Chip) designs. The invention solves a longstanding problem with timing analysis of designs, namely, the ability to multi-thread the design under analysis. The invention provides for slicing a design into levels, further decomposing each level into gates, and the multi-threaded processing of gates so that the solution of large design analysis is generated significantly faster than current approaches. Further, the invention provides that only one level exists in the RAM at any time. Once the arrival time on the level is computed, the data is saved to disk immediately. Because the memory footprint is sub-linear to the size of the design, entire system-on-a chip designs may be nm on inexpensive, off-the-shelf hardware.

Sensitivity-based complex statistical modeling for random on-chip variation

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San Jose, CA, United States of America

Guy Maor