Virginia Tech Intellectual Properties Inc

Lasag S.a.

Guy Indebetouw

Ting-Chung Poon

Brian Storrie

Bradley Schilling

An optical scanning holography system which requires only a two dimensional scan to record three dimensional information from a fluorescent specimen wherein the optical scanning holography is based on scanning the specimen with a Fresnel zone pattern and detecting and decoding the fluorescent light reflected from the specimen. The flourescent light reflected from the specimen contains three dimensional information about the specimen so that once the fluorescent light is detected and decoded a three dimensional image of the specimen can be obtained and displayed using only the two dimensional scan.

Three-dimensional holographic fluorescence microscope

A process and mask for use in the process making it possible optically to measure precisely and rapidly sizes in elevation. A group of fringes of regular light, in uniform translation at constant velocity, is projected on the object to be measured and the image of the projected fringes is observed. The measurement of the phase difference of the reflected or diffused light signal at two points of the masked image plane is proportional to a variation in the relative height of the two corresponding object points, thereby allowing comparison to a control piece. The process makes it possible to measure absolute or relative sizes in elevation at two critical points of pieces in a production line. It also makes it possible to determine the profile of any piece.

Growing community of inventors

Blacksburg, VA, United States of America

Guy Indebetouw