Agilent Technologies, Inc.

Guthrie Partridge

Mark Denning

Gershon Perelman

Kenneth R Newton

Trygve Ristroph

Mehrnoosh Vahidpour

Noah Goldberg

A system adapted for characterizing gain chips and a method for characterizing gain chips are disclosed. The system includes a probe light source that generates an output light signal characterized by a wavelength that can be varied in response to a wavelength control signal and a mounting stage adapted for receiving a gain chip characterized by a waveguide having a reflective face on a first surface of the gain chip and a transparent face on a second surface of the gain chip. The system also includes an optical system that focuses the output light signal into the waveguide through the transparent face; and a controller that causes the probe light source to generate the output light signal and measures an intensity of light both with and without the gain chip being powered for each of a plurality of different wavelengths to form a gain profile for the gain chip.

Method and apparatus for characterizing laser gain chips

An apparatus that includes a gain chip assembly, an external cavity, and a controller is disclosed. The gain chip assembly includes first and second gain chips that are coupled optically such that light travels serially between the first gain chip and the second gain chip, each gain chip is electrically biased. The electrical bias of the first gain chip is independent of the electrical bias of the second gain chip. The external cavity has a tunable wavelength selective filter that is changed in response to a control signal. Light in the external cavity passes through the gain chip assembly. The controller determines the tunable wavelength selective filter, and the electrical bias of each of the gain chips so as to cause the apparatus to lase at a wavelength specified by a control signal to the controller.

Quantum cascade laser with serially configured gain sections

A light source having a gain chip, a retro reflecting prism and a first actuator is disclosed. The gain chip amplifies light passing therethrough. The retro reflecting prism is characterized by a pivot axis within the retro reflecting prism, an input light direction, an output light direction, and a diffraction grating that receives light emitted by the gain chip traveling in the input direction, returns a diffracted light beam to the gain chip along the input light direction and generates an output light beam. The first actuator causes the retro reflecting prism to rotate about the pivot axis in response to a control signal being coupled to the first actuator.

Wavelength tunable external cavity quantum cascade laser utilizing an angle tuned immersion grating as a wavelength selective filter element

An ion guide generates a radio frequency (RF) field to radially confine ions to an ion beam along a guide axis as the ions are transmitted through the ion guide. The effective potential of the RF field has potential wells distributed along the guide axis. The RF field is constructed such that the potential wells move in an axial direction toward an exit end of the ion guide.

Traveling-well ion guides and related systems and methods

A mass spectrometry (MS) system may be cleaned by generating plasma and contacting an internal surface of the system to be cleaned with the plasma. The system may be switched between operating in an analytical mode and in a cleaning mode. In the analytical mode a sample is analyzed, and plasma may or may not be actively generated. In the cleaning mode the plasma is actively generated, and the sample may or may not be analyzed.

Plasma cleaning for mass spectrometers

A plasma source for generating microwave-induced plasma includes a plasma torch integrated with a microwave energy source. The torch establishes a gas flow path from one side of the plasma source to the other side. The torch may be integrated with the microwave energy source such that a plasma-forming gas flowing through the torch is subjected to microwave radiation, which serves to initiate and/or sustain plasma in the torch. The plasma may be ejected from the torch and utilized in various applications involving the use of plasma, including analytical techniques such as optical emission spectrometry and mass spectrometry.

Integrated magnetron plasma torch, and related methods

An electron capture dissociation (ECD) apparatus includes a plasma source for generating plasma. Analyte ions are exposed to the plasma in an ECD interaction region, either inside or outside the plasma source. The apparatus may include one or more devices for refining the plasma in preparation for interaction with the analyte ions. Refining may entail removing unwanted species from the plasma, such as photons, metastable particles, neutral particles, and/or high-energy electrons unsuitable for ECD, and/or controlling a density of low-energy electrons in the plasma.

Plasma-based electron capture dissociation (ECD) apparatus and related systems and methods

A photon source includes a plasma source for generating plasma and a photon guide through which the plasma travels. The photon guide includes an inner surface configured for reflecting photons emitted from the plasma. As the plasma travels through the photon guide, plasma electrons and ions recombine at the inner surface, whereby the predominant species emitted from an outlet of the photon guide are the photons and neutral particles, with few or no plasma electrons and ions being emitted.

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Santa Clara, CA, United States of America

Guthrie Partridge