Boe Technology Group Co., Ltd.

Chengdu Boe Optoelectronics Technology Co., Ltd.

Guolin Zhang

Jiuyang Cheng

Jiahong Zou

Quanguo Zhou

Hongxiang Shen

Xun Huang

Junliang Li

Wenhao Xiao

Kaiqin Xu

Zhidong Wang

Hao Tang

Qing Zhang

Lijia Zhou

Yihong Ma

Liangfeng Mou

A method for classifying an image of a displaying base plate includes: acquiring an image to be checked; from a first predetermined-type set, determining a type of the image to be checked. The first predetermined-type set includes: a first image type, a second image type and a third image type. An image of the first image type is a no-defect image, an image of the second image type is a blurred image, and an image of the third image type is a defect image. When the type of the image to be checked is the third image type, by using a first convolutional neural network, determining a defect data of the image to be checked, wherein the defect image refers to an image of a displaying base plate having a defect, and the defect data contains a defect type of the displaying base plate in the image to be checked.

Method and apparatus for classifying image of displaying base plate

Provided is a method for acquiring images. The method includes: acquiring a first image embodying a display panel; determining repair indication information of a plurality of defects in the display panel in the first image, wherein the repair indication information indicates a degree of a repair demand for the defects; selecting a target defect from the plurality of defects based on the repair indication information of the plurality of defects; and acquiring a repair reference image embodying the target defect by photographing the target defect in the display panel.

Method and apparatus for acquiring images, and storage medium thereof

An image processing method includes: receiving a processing instruction for an image; screening out a plurality of target images from a plurality of acquired images; determining a first feature value and a second feature value of the target area of each of the target images; determining a similarity between the first feature values of the target areas in every two target images according to all the determined first feature values, and determining a similarity between the second feature values of the target areas in every two target images according to all the determined second feature values; and, if a first target similarity is within a first preset range, and a second target similarity is within a second preset range, determining that a first image and a second image belong to the same image set.

Image processing method, apparatus, computer device and storage medium

The present disclosure discloses an OLED encapsulation structure, a display device and a method for manufacturing an OLED encapsulation structure. The OLED encapsulation structure includes an OLED device and a plurality of film layers covering the OLED device. The plurality of film layers includes an inorganic layer and an organic layer stacked alternately, and contacting surfaces of any two film layers in contact with each other among the plurality of film layers include complementary topographies such that the any two film layers in contact with each other are stuck with each other.

OLED encapsulation structure, display device and method for manufacturing OLED encapsulation structure

The present disclosure provides an array substrate, a manufacturing method of an array substrate, and a display device. The array substrate includes: a base substrate; a first signal line, extending in a first direction and located on the base substrate; a second signal line, extending in a second direction and located on a side of the first signal line away from the base substrate and insulated with the first signal line, the first direction and the second direction crossing with each other. A side of the first signal line facing the second signal line is provided with a groove, the groove is located at a crossing region between the first signal line and the second signal line, in the crossing region, an otherographic projection of the second signal line on the base substrate completely falls into an orthographic projection of the groove on the base substrate.

Array substrate, manufacturing method thereof, and display device

Growing community of inventors

Beijing, China

Guolin Zhang