Boe Technology Group Co., Ltd.

Guoliang Shen

Tian Lan

Haohan Wu

Dong Chai

Yue Tang

Fei Yuan

Weihe Liu

Hong Wang

Jianmin Wu

Jianzhou Wang

Yingli Zeng

Guanchun Bai

The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.

System and method for producing display panels based on nonlinear program model, and non-transitory computer-readable storage medium

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to defects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to detects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis

A system for recommending a maximum quantity of work in process, in which one or more processors of a distributed storage device are configured to execute: acquiring at least part of production data stored in the distributed storage device, the production data includes quantity records and cycle time records of a production line in time periods, and the cycle time record of each time period includes a cycle time at each process station of the production line in said each time period; clustering the quantity records to obtain a plurality of initial classifications, each initial classification includes at least one quantity record; determining a portion of the initial classifications as preferred classifications; determining the maximum quantity of work in process at each process station; and a display device is configured to display the maximum quantity of work in process at each process station determined by an analysis device.

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Beijing, China

Guoliang Shen