Xilinx, Inc.

Guo Jun Ren

Qi Zhang

Ketan Sodha

Jian Tan

Prasad Rau

An integrated circuit that equalizes delay across process corners. A delay equalizer circuit is used to adjust and maintain a relatively constant delay across different process corners. The delay equalizer circuit includes a process monitor and a delay compensator circuit coupled to the process monitor. The process monitor may output a compensating bias voltage for a pMOS transistor and a compensating bias voltage for an nMOS transistor. The compensating bias voltages may be used to regulate and maintain a relatively constant delay through the delay compensator circuit across varying process corners.

Process compensated delay line

A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device.

Method and apparatus for a process, voltage, and temperature variation tolerant semiconductor device

A circuit for determining a process corner for a CMOS device of an integrated circuit is disclosed. The circuit comprises a CMOS monitoring circuit comprising an NMOS transistor and a PMOS transistor of the integrated circuit; reference circuit comprising elements for generating a reference voltage for an NMOS transistor and a reference voltage for a PMOS transistor; a first comparator for comparing a voltage generated by the NMOS transistor monitored by the CMOS monitoring circuit with the reference voltage for a NMOS transistor; and a second comparator for comparing a voltage generated by the PMOS transistor monitored by the CMOS monitoring circuit with the reference voltage for a PMOS transistor. A method for determining a process corner for CMOS devices of an integrated circuit is also disclosed.

Circuit for and method of determining a process corner for a CMOS device

A method and apparatus to reduce the degradation in performance of semiconductor-based devices due to process, voltage, and temperature (PVT) and/or other causes of variation. Adaptive feedback mechanisms are employed to sense and correct performance degradation, while simultaneously facilitating configurability within integrated circuits (ICs) such as programmable logic devices (PLDs). A voltage-feedback mechanism is employed to detect PVT variation and mirrored current references are adaptively adjusted to track and substantially eliminate the PVT variation. More than one voltage-feedback mechanism may instead be utilized to detect PVT-based variations within a differential device, whereby a first voltage-feedback mechanism is utilized to detect common-mode voltage variation and a second voltage-feedback mechanism produces mirrored reference currents to substantially remove the common-mode voltage variation and facilitate symmetrical operation of the differential device. Edge boosting modules are employed to improve performance during reduced output common mode voltage modes of operation.

An output circuit providing an adjustable output amplitude and common-mode voltage is described. The output circuit includes at least one driver circuit and a common-mode feedback circuit including a first replica circuit of the at least one driver circuit. The common-mode feedback circuit is coupled to receive a first bias and provide an output coupled to the at least one driver circuit. The output circuit may also include a current circuit having a configurable resistor and a second replica circuit of the at least one driver circuit. The current circuit may be coupled to receive a second bias and to provide an output coupled to the at least one driver circuit and the common-mode feedback circuit.

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San Jose, CA, United States of America

Guo Jun Ren