Hon Hai Precision Industry Co., Ltd.

Fu Tai Hua Industry (Shenzhen) Co., Ltd.

Guo-Dong Liang

Wei-Da Yang

Eddy Liu

Xiao-Feng Hou

A system for determining a position of a test probe of a test fixture applied to a test pad on a dummy board is disclosed. The test pad includes conductive test zones, resistors, a first insulating zone, and a plurality of second insulating zones. Each resistor has a different resistance. Each resistor is connected to a different test zone. The test zones include a first test zone and a surrounding plurality of second test zones. The first test zone is insulated from the second test zones by the first insulating zone. Adjacent second test zones are insulated from each other by a different second insulating zone. Probe correction can be carried out according to the value of resistance read by a resistance measuring device which stores a correspondence table, and position of the probe adjusted accordingly.

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Shenzhen, China

Guo-Dong Liang