Multitest Elektronische Systeme Gmbh

Günther Jeserer

Stefan Thiel

Andreas Wiesböck

Alexander Bauer

Franz Pichl

Max Schaule

Michael Hertkorn

Efe Varol

A handler for electronic components, in particular IC's, comprising a feed unit for plungers with a pneumatic cylinder unit that can be displaced and that is coupled to a pneumatic cylinder displacement unit, which moves said cylinder unit back and forth in the axial direction of the plungers.

Handler for electronic components, in particular IC'S, comprising a pneumatic cylinder displacement unit for moving plungers

A plunger for holding and moving electronic components in particular for introduction and removal of IC's to and from a contacting device connected to a test bed comprises a plunger head with at least one suction head for sectional contact with a component. A heat-conducting body, temperature-controlled by means of a fluid, is arranged such that the suction-contacted component is in contact with the heat-conducting body. The suction head passes through the heat-conducting body.

Plunger for holding and moving electrical components

A plunger for holding and moving electrical components in particular IC's to and from a contacting device connected to a test bed, comprises a head piece with a fluid distribution chamber through which temperature-controlled fluid flows. A suction head is arranged such that the temperature-controlled fluid flows around the suction head and is diverted along the suction head to the component.

Plunger for holding and moving electronic components in particular ICS

A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station.

Handler for electronic components, in particular IC's, comprising circulating units, the temperature of which can be controlled

In the case of a position-correction device for correcting the position of a component holder of a handling apparatus for electronic components, in particular ICs, a base plate and a centering frame which can be displaced in relation to the base plate are provided in the region of a contact unit. A drive device is also provided and is operatively connected to the centering frame in order to displace the centering frame and thus the component holder inserted into the centering frame as a function of correction values which are calculated by a computation device on the basis of measured values which are obtained by a position-detection device for detecting the actual position of the component which is to be tested and is held in the component holder.

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Tuntenhausen, Germany

Günther Jeserer