Ernst Leitz Wetzlar Gmbh

Gunter Reinheimer

Herbert Leiter

Winfried Kraft

Norbert Gaul

Burkhard Neumann

Hans Determann

Hans W Stankewitz

An automatic focusing apparatus for optical instruments, in particular for reflected light microscopes, wherein a measuring point is produced on the surface of an object by an eccentric measuring beam formed by blocking a portion of the path of a full beam. The measuring point is imaged onto a photoelectric device by reflecting the measuring beam along the blocked out path. When the object plane wanders from the focal plane, the photoelectric device actuates a control device which returns the object plane to the focal plane. The apparatus comprises a source of light to produce a, preferably pulsed, laser light for the full measuring beam, an optical structural element for geometrically blocking one-half of the full measuring beam to produce the eccentric measuring beam and simultaneously for geometrically blocking the reflected measuring beam from the path of the full measuring beam. A lens is positioned in the measuring beam and a photodetector device in the form of a differential photodiode pair is positioned to receive the reflected measuring beam. A divider mirror, preferably dichromatic, is provided for introducing the measuring beam into the path of the illuminating beam of the optical device and for reflecting the reflected measuring beam from the path of the illuminating beam of the optical instrument.

Apparatus for automatically focusing objects to be viewed in optical

An incident light illumination apparatus for generating light and dark field illumination along an optical axis. The illumination apparatus is coupled to a stage arm of a microscope and a microscope tube is coupled to the illumination apparatus. An illumination stub (7) is located in the illumination apparatus along the optical axis between a light source (8) and an optical deflecting element (11). An aperture (13) passes through the stub from side-to-side for the interchangeable insertion of an insertion module (14,15). This insertion module contains at least two functional groups (I,II; III,II) which can be sequentially placed into the optical axis (9) and the functional groups consist of light attenuating (25) and/or light bounding (19,20,23,24,27) optical components, and additional means (28,29) for pivoting a center stop (30) into the optical axis (9).

Incident light illumination instrument for selective light and dark

An attachment camera for microscopes, comprising an apparatus for measuring the brightness of an object detail and markings for sighting at least the detail metering field and the image field of the camera in the observation beam. The metering field markings and the image field markings are located on two separate plates, the plate with the metering field marking is defined by a measuring field stop. The two markings differ in size and shape and are simultaneously reflected into the observation beam by means of a photographic ocular located in the picture taking beam and by means of optical components with partly or fully reflecting surfaces located before or after the photographic ocular. A holder (5a) seating in exchangeable manner the photographic ocular (5) is provided between the housing (24) of the attachment-camera and the binocular tube (25).

Microscope attachment camera

Photomicrographic exposure meter for cameras attached to microscopes in which part of the picture-taking beam is reflected by means of a beam-splitter and where the reflected beam part projects an image of the object onto an image plane, measuring field stop is located in the image plane with an aperture for detail or spot measurements and an insertable photo-electric detector cooperates therewith downstream of the stop in the direction of light. The beam part is reflected by at least one specular means (12,61) to the measuring field stop (13). The stop is gimbal-suspended and means are provided both for displacing the gimbal-suspended specular means (12,61) and for viewing the object detail appearing in the stop aperture.

Exposure meter for photomicrography

Direct illumination apparatus for microscopes for generating illumination of light fields, phase contrasts, interference contrast and dark fields. A deflecting mirror is located in the observation beam, which is partly specular at its center region and fully specular in an annular zone, and an annular condensor is associated with the illumination system. The apparatus is provided with an adjustable stop or diaphragm for the purpose of suppressing the light field beam and with optical components for illuminating an objective pupil for the light field and the annular condensor with collimated light for the dark field. An aperture stop is located in the path of the light field beam nearly or approximately limiting the illumination of the object field in the path of the dark field beam. An annular lens (17) is mounted centrally to the optical axis (15) in the at least approximately collimated dark field beam, this annular lens imaging the diaphragm or aperture stop plane (7) in a plane (18) located near the threaded portion (3') of microscope objective (3).

Direct illumination apparatus for light and dark field illumination

Microscope-attachment camera with a system for measuring the brightness of an object detail and with markings for indicating at least the detail metering-field and the image-field of the camera in the observation beam. The metering field-marking (14) and the image field-marking (22) are positioned on two separate plates, the metering field-marking plate being designed as a metering field-stop (14), and the two markings which differ in shape and size (14,22) are simultaneously reflected into the observation beam.

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Biebertal, Germany

Gunter Reinheimer