Samsung Electronics Co., Ltd.

Gunok Jung

Minsu Kim

Donggyu Lee

Hoijin Lee

Yongjin Yoon

Ukrae Cho

An electronic device includes an internal device and a voltage tester. The internal device includes a power supply source input terminal. The voltage tester supplies one of first and second power supply source voltages to the power supply source input terminal of the internal device, in response to a test signal. The first and second power supply source voltages have different voltage levels. The first power supply source voltage has a voltage level within a normal range required for normal operations of the internal device. The second power supply source voltage has an abnormal voltage level outside the normal range.

Electronic device with power tester

A flip-flop circuit includes an input portion that receives a first external input signal through a first external input terminal, a storage portion that stores a signal transmitted from the input portion, and an output portion that outputs the signal stored in the storage portion through an external output terminal as a logic operation result with respect to a second external input signal received through a second external input terminal of the input portion. The output portion includes a logic gate directly connected to the external output terminal and an input terminal of the logic gate receives the signal stored in the storage portion.

Flip-flop circuits

A latch circuit includes a first tri-state inverter configured to invert an input voltage in response to a pulse and to output the inverted voltage to a first node, a second tri-state inverter connected between the first node and a second node and to invert a voltage of the second node in response to an inverted pulse being an inverted version of the pulse, and a variable inversion unit connected between the first node and the second node. The variable inversion unit adjusts a logical threshold value according to a logical value corresponding to a voltage of the first node and inverts a voltage of the first node based upon the adjusted logical threshold value, the logical threshold value indicating a voltage for discriminating the logical value.

Growing community of inventors

Yongin-si, South Korea

Gunok Jung