Samsung Electronics Co., Ltd.

Gun-Won Lee

Jin-Ho Choi

Si-Hyoung Lee

Seung-Hwan Park

Kyoung-Ho Yang

A liquid crystal display is modified to support exhaustive, quantitative testing after assembly while requiring only a limited number of test pads. Multiple data lines are connected to form data line blocks on-board the display but outside the active area of the array for testing purposes. Each data line block is connected to a corresponding test pad via a control switch, the control switches being preferably formed of TFTs and controlled by test gate lines arranged perpendicular to the data lines in matrix form.

Test circuit for identifying open and short circuit defects in a liquid

A probe control method of a probe station which levels the probe pins before testing a large area substrate such as a thin film transistor circuit substrate using a probe station, which includes the steps of connecting a pin of a probe station to a resistance material; measuring and reading the resistance between adjacent pins using a resistance measuring device; and leveling the probe pins using a pin control device at the probe station.

Growing community of inventors

Kyungki-do, South Korea

Gun-Won Lee