Nanometrics Inc.

Guillermo L Toro-Lira

Duane C Holmes

Vincent J Coates

A computerized stage assembly for a Scanning Electron Microscope including a support frame, a tilt frame pivotally coupled to the support frame, an X carriage engaged with the tilt frame for movement in an X direction, a Y carriage engaged with the X carriage for movement in a Y direction, and a pedestal carried by the Y carriage and capable of rotation around an axis substantially normal to both the X and Y directions. The tilt frame, X and Y carriages, and pedestal are moved by computer controlled step motors. The tilting and rotating of a specimen secured to the pedestal is non-eucentric, i.e. the axis of rotation or tilt is not necessarily through the point of inspection on the specimen. A method is disclosed for automatically returning an inspection point to the viewing field of the microscope after a non-eucentric rotation or tilt.

Microscope stage assembly and control system

In scanning electron microscopes the field established between the focusing lens housing at ground potential and the secondary emission electron detector at a positive potential attracts and carries the secondary electrons to the detector. This field is often displaced from the secondary emission source so that much of the emission is attracted to other areas of the microscope and is lost to the detector. To greatly improve detection efficiency, an electron attracting grid at a potential between that on the detector and the focusing lens housing ground reference potential is interposed between the detector and the specimen and positioned so that the new field established between grid and lens housing dips down toward the specimen surface and thus collects substantially all of the secondary emission electrons which then are attracted to higher potential on the detector.

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Mountain View, CA, United States of America

Guillermo L Toro-Lira