Smiths Heimann Sas

Smiths Detection France S.a.s.

Guillaume Jegou

Serge Maitrejean

Christophe Mielot

Sébastien Grabeuil

Jean-Michel Faugier

Cindy Bergerat

Agathe Brabant

In some embodiments, a method for processing inspection data associated with cargo irradiated by a plurality N of pulses of inspection is provided. The method includes obtaining the inspection data, the inspection data being representative of intensity values of pixels of an inspection image of the including data associated with a higher energy mode, and data associated with a lower energy mode; generating a histogram having, as a first axis, bins corresponding to pixel intensity values HM associated with the higher energy mode and, as a second axis, bins corresponding to pixel intensity values LM associated with the lower energy mode; selecting a bin corresponding to a most frequent bin of the pixel intensity values HM; and generating a transformation table by mapping each bin of the pixel intensity values LM with the selected bin of the pixel intensity values HM.

Resolution improvement in dual energy

A method for inspecting cargo with is disclosed. The method includes scanning the cargo with a matrix including at least two rows of detectors, wherein each zone of the cargo irradiated by a first X ray pulse is irradiated by at least one second X ray pulse, and a radiation corresponding to the first X ray pulse is detected by a first row of the matrix, and a radiation corresponding to the at least one second pulse is detected by at least one second row of the matrix, generating a first image of the cargo and at least one second image of the cargo, determining, for each zone of the cargo irradiated, a local mutual parasitic displacement between the cargo and the matrix, determining a total mutual parasitic displacement, and generating a corrected image of the cargo without the mutual parasitic displacement.

Correction of images

In one embodiment, there is provided detector for an inspection system, including at least one first scintillator configured to, in response to interaction with a pulse of inspection radiation, re-emit first light in a first wavelength domain, at least one second scintillator configured to, in response to interaction with the pulse of inspection radiation, re-emit second light in a second wavelength domain different from the first wavelength domain, and at least one first sensor configured to measure the first light and the second light.

Method and detector for inspection system

An inspection radiation source is provided. The inspection radiation source includes an electron accelerator for generating an electron current, and a target for the electron current including a first part and a second part. This first part is configured to be at least partly exposed to the electron current on an impact area having a first width in a direction substantially perpendicular to the electron current, and inhibit propagation of the electron current. The second part has a second width in the direction substantially perpendicular to the electron current, the second width of the second part being smaller than the first width of the impact area, the second part being configured to be at least partly exposed to the electron current, and generate inspection radiation by emitting X-rays in response to being exposed to the electron current.

Radiation source

In one aspect, it is disclosed a detection system comprising: a plurality of detectors, each detector being configured to detect radiation scattered by an associated respective portion of a load to inspect, the radiation being scattered in response to the respective portion being irradiated by radiation transmitted through the portion; and a plurality of collimators associated with the plurality of detectors, each collimator of the plurality of collimators being associated with a respective detector of the plurality of detectors and being configured to, for each detector of the plurality of detectors: enable radiation scattered by the respective portion of the load to reach the associated detector of the plurality of detectors, and inhibit other scattered radiation from reaching the associated detector.

Scatter imaging

In one embodiment, there is provided a detection device () for a system for inspection of cargo, comprising: at least one scintillator () configured to re-emit light in response to: interaction with successive first radiation pulses () emitted by a generator (), and/or interaction with second radiation () generated by a radioactive source () located in the cargo () to inspect; at least one first acquisition line () configured to measure a quantity associated with the light re-emitted by the at least one scintillator in response to interaction with the successive first radiation pulses; and at least one a second acquisition line () configured to measure a quantity associated with the light re-emitted by the at least one scintillator in response to interaction with at least the second radiation.

Scanning apparatus and method for the detection of objects concealed in cargo

In examples, it is disclosed an inspection system comprising: a secondary source of radiation configured to generate secondary electromagnetic radiation for inspection of a load in response to being irradiated by primary electromagnetic radiation from a primary generator of electromagnetic radiation; and one or more detectors configured to detect radiation from the load after interaction with the secondary inspection beam.

Inspection system with source of radiation and method

In one aspect, it is disclosed a system for inspection of a load, comprising: a detection device configured to detect, after transmission through the load, successive radiation pulses emitted at a predetermined frequency by a source, the load being in movement in an inspection direction, at an inspection speed with respect to the system, the detection device comprising a matrix of a plurality of arrays of detectors, wherein the matrix has a width associated with the inspection direction, the width of the matrix being based on the inspection speed of the load and the predetermined frequency of the successive radiation pulses.

Inspection system with a matrix and method

An inspection system () having: &#x22c5; a source () configured to generate inspection radiation (); &#x22c5; a collimator () configured to collimate the inspection radiation into an inspection beam () configured to irradiate a section of a vehicle (); &#x22c5; a filter () located between the source and the collimator, the filter having at least a cargo configuration and an attenuation configuration; and &#x22c5; a controller () configured to control the configuration of the filter, such that the filter is in the cargo configuration when the inspection beam irradiates a container (), and in the attenuation configuration when the inspection beam irradiates a cabin ().

Growing community of inventors

Vitry sur Seine, France

Guillaume Jegou