Texas Instruments Corporation

Guha Lakshmanan

Rakesh Hariharan

Lakshmanan Balasubramanian

Sudhind Dhamankar

Sandeep Tare

Ibinu Alaudeen Nadeera

Venkateswaran Padmanabhan

Vipin Sharma

Kriyangbhai Shah

A method includes obtaining input signal values and output signal values from an integrated circuit and providing the obtained input signal values and output signal values to a machine learning model. The method further includes obtaining, from the machine learning model, a predicted set of signal values, wherein the predicted set of signal values correspond to signals internal to the integrated circuit and comparing the predicted set of signal values to one or more expected signal values for debugging the integrated circuit.

Machine learning techniques for circuit design debugging

A packaged electronic device has a die with a load circuit, a resistor and an analog to digital converter (ADC). The resistor is coupled between a supply node of the die and a power input of the load circuit. The ADC has a first input coupled to a first terminal of the resistor, and a second input coupled to a second terminal of the resistor to measure a voltage across the resistor while a supply voltage is applied to the supply node to determine a load current conducted by the load circuit. A method of manufacturing a packaged electronic device includes wafer processing to fabricate the load circuit, the resistor and the ADC on or in a die area of the wafer with the resistor coupled between the power input of the load circuit and the supply node of the die area.

On-chip current sensor

Aspects of the present invention provide a system and method for checking a portion of an analog circuit using a digital checker. The method includes establishing a target in the analog circuit, creating an analog target dummy for the target, creating a digital target dummy, binding the digital target dummy to the analog target dummy, and checking a value of the digital target dummy with a digital checker.

System and method for checking analog circuit with digital checker

Growing community of inventors

Bengaluru, India

Guha Lakshmanan