Agilent Technologies, Inc.

Guenther Tietz

Michael Fleischer-Reumann

Thomas Burger

Martin Heinen

Peter Schinzel

A method for testing a digital circuit as a Device under Test&#x2014;DUT, including determining a Bit Error Rate&#x2014;BER&#x2014;value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

Bit error rate measurement

For identifying or localizing a serial data stream in a deserialized output provided at a plurality of n output ports (PORT-PORT), a pattern recognition is provided at each one of the plurality of n output ports (PORT-PORT) for recognizing a deserialized identifier pattern corresponding to an identifier pattern within the serial data stream and for detecting a phase of the deserialized identifier pattern in the deserialized output. The phase of the output of each respective port (PORT-PORT) is then shifted in correspondence with the detected phase of the deserialized identifier pattern.

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Leinfelden-Echterdingen, Germany

Guenther Tietz