Maschinenfabrik Reinhausen Gmbh

Guenther Siebert

Andreas Thiede

Martin Hinow

Uwe Stephan

Ralf Bergmann

Enrico Bilinski

Ullrich Clemens

A choke is used to carry out high-voltage tests. The choke includes: a housing; a coil arranged in an interior of the housing; at least one electrically conductive component arranged between the coil and the housing; and a flux guide configured to guide a magnetic flux that is configured to be generated by the coil. The flux guide includes a ferromagnetic material; and is arranged between the coil and the at least one electrically conductive component in such a way that the magnetic flux that is configured to be generated by the coil is guided past the electrically conductive component.

Choke and test assembly for carrying out high-voltage testing

The present invention relates to a test system for high-voltage technology devices, in particular shunt reactors, as defined in the preamble of independent patent claim. The invention also relates to a method which can be carried out with this test system and is intended to test high-voltage technology devices according to coordinate patent claim. The general idea of the test system according to the invention is to provide a continuously adjustable inductance and a capacitance, which can be adjusted in discrete steps, on the secondary side of the test transformer in such a manner that said components form a series resonant circuit together with the test object in the form of an inductance. In the method which can be carried out with the test system according to the invention, a rough adjustment of the test system is carried out using the discretely adjustable capacitances of the capacitor bank by connecting individual capacitances of the capacitor bank via an iterative process if an undercapacitance is measured in the test system by means of a measuring device or by disconnecting individual capacitances if an overcapacitance is measured by means of the measuring device until a predefined threshold value of an overcapacitance prevails, with the result that fine tuning of the test system is then carried out by means of the continuously adjustable inductance in such a manner that said components form, together with the test object in the form of an inductance, a series resonant circuit which can be tuned to the point of resonance thereof.

Test system and method for testing high-voltage technology

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Dresden, Germany

Guenther Siebert