Carl Zeiss Jena Gmbh

Guenter Schoeppe

Stefan Wilhelm

Ulrich Simon

Hartmut Heinz

Bernhard Groebler

Ralf Wolleschensky

Gunter Moehler

Sebastian Tille

Thomas Weyh

Michael Stock

A laser scanning microscope comprises at least one selectively switchable micro-mirror arrangement (DMD) in the illumination beam path and/or detection beam path which is used for the wavelength selection of dispersively divided illumination and/or object light such as reflection, fluorescence.

Arrangement for illumination and/or detection in a microscope

In a laser scanning microscope comprising a deflecting device, which is provided for variable deflection of a laser beam about a deflection angle, and a control unit, which controls the deflecting device via a control signal and measures, at least temporarily, a present deflection angle value, it is envisaged that, at the time of measurement of the present deflection angle value, a testing structure, which comprises at least one structural element whose position is assigned to a predetermined deflection angle value, is arranged downstream of the deflecting device, a detecting device is provided, which emits a detection signal when the laser beam is directed to the structural element, and the control unit assigns the present control signal to the predetermined deflection angle value upon reception of the detection signal.

Laser scanning microscope

Process and apparatus for determining surface information using a projected structure with a periodically changing brightness curve

Arrangement and method for focus monitoring in a microscope with digital image generation, preferably in a confocal microscope. The arrangement provides an additional, rotatably supported transparent optical component in the known construction of a microscope in front of a main beam splitter arranged in the beam path in the area of a parallel illumination beam path. According to the method, the images required for focus monitoring are recorded with a transparent optical component inclined by angle &plus;&agr; or &minus;&agr;. The images are checked for correlation of the image contents in the direction of beam displacement by pixel-by-pixel displacement. The determined displacement &Dgr;s at optimum correlation represents a measurement of the instantaneous focusing or defocusing. The suggested solution for focus monitoring is applicable with slight adaptations for all microscopes outfitted with digital image-generating methods and arrangements. In confocal microscopes, applicability to defocusing is limited in a range of about 5 to 8&times;&lgr;/NA .

Arrangement and method for focus monitoring in a microscope with digital image generation, preferably in a confocal microscope

An arrangement for wavelength-dependent adjustment of light beam, preferably laser radiation of different wavelengths, preferably in a laser scanning microscope, wherein the light beam is split by a dispersive element and reaches a concave mirror, and an adjustable device for at least partially cutting out individual wavelengths or wavelength ranges of the incident and/or reflected beam is located in front of the concave mirror.

Arrangement for wavelength-dependent adjustment of light beam

An arrangement and corresponding method are provided for coupling radiation, preferably laser radiation, into a scanning head with a scanning unit in at least two dimensions. The radiation is focussed on an object via a microscope objective via at least one light-conducting fiber which is coupled with the scanning head. A collimator is arranged downstream of the fiber end at the scanning head for collimating the radiation exiting in a divergent manner at the fiber end.

An arrangement and corresponding method are provided for coupling radiation, preferably laser radiation, into a scanning head with a scanning unit in at least two dimensions. The radiation is focussed on an object via a microscope objective via at least one light-conducting fiber which is coupled with the scanning head. A collimato is arranged downstream of the fiber end at the scanning head for collimatiing the radiation exiting in a divergent manner at the fiber end.

Laser scanning microscope with displaceable confocal diaphragms

System and method for monitoring the laser radiation coupled into a scanning head in a laser scanning microscope

A device for the adjustable coupling of wavelengths or wavelength regions into the illumination beam path of a microscope, preferably in the beam path of a confocal microscope, comprising at least one dispersive element for wavelength separation of the illumination light and at least one at least partially reflecting element arranged in the wavelength-separated portion of the illumination light for reflecting back a wavelength region in the direction of the microscope illumination, and a device for the adjustable detection of object light coming from an illuminated object, preferably in a microscope beam path, comprising at least one dispersive element for wavelength separation of the object light and means arranged in the wavelength-separated portion of the object light for the adjustable stopping down or cutting out of at least one wavelength region and deflection in the direction of at least one detector.

Adjustable coupling in and/or detection of one or more wavelengths in a microscope

A control system for a scanner is disclosed, especially for a laser scanning microscope, with an oscillating motor for driving an oscillating mirror serving for the linearly oscillating deflection of a beam bundle, with a control unit for supplying the oscillating motor with an exciting current which is variable with respect to the control frequency, frequency curve, and amplitude, with a function generator which is connected with the control unit, and with a measurement value transducer for obtaining a sequence of information about the deflection positions of the oscillating mirror. The measurement value transducer is connected with the function generator by way of a logic unit for determining correction values for the exciting current. Accordingly, it is advantageously possible, by evaluating the information supplied by the measurement value transducer about the actual deflection position of the oscillating mirror, to determine correction values with the assistance of the logic unit. These correction values can be used, in turn, to influence the control frequencies emitted by the function generator in such a way that deviations are minimized or completely prevented.

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Jena, Germany

Guenter Schoeppe