Texas Instruments Corporation

Guangxu Li

Jaimal Mallory Williamson

Rajen Manicon Murugan

Yiqi Tang

A semiconductor package includes a multilayer package substrate including a top layer including a top dielectric layer and a top metal layer providing a top portion of pins on top filled vias, and a bottom layer including a bottom dielectric layer and a bottom metal layer on bottom filled vias that provide externally accessible bottom side contact pads. The top dielectric layer together with the bottom dielectric layer providing electrical isolation between the pins. And integrated circuit (IC) die that comprises a substrate having a semiconductor surface including circuitry, with nodes connected to bond pads with bonding features on the bond pads. An electrically conductive material interconnect provides a connection between the top side contact pads and the bonding features. At least a first pin includes at least one bump stress reduction structure that includes a local physical dimension change of at least 10% in at least one dimension.

Multilayer package substrate with stress buffer

An electronic device with a multilevel package substrate having multiple levels including a first level having conductive leads and a final level having conductive landing areas along a side, as well as a die mounted to the multilevel package substrate and having conductive terminals electrically coupled to respective ones of the conductive leads, and a package structure that encloses the die and a portion of the multilevel package substrate, where the multilevel package substrate has a conductive elevated trace layer with a confinement feature that extends outward from the side of the final level along a third direction that is orthogonal to the first and second directions, the confinement feature having a sidewall configured to laterally confine one of a solder, an adhesive, a side of a passive component, and a side of the die.

Electronic device and multilevel package substrate with elevated trace features for solder and/or die confinement and method for fabricating the electronic device

A described example includes a package substrate having an array of die pads arranged in rows and columns on a die mount surface, and having an opposing board side surface; a solder mask layer overlying the die mount surface; a first plurality of solder mask defined openings in the solder mask layer at die pad locations, the solder mask defined openings exposing portions of a surface of corresponding die pads, the surface facing away from the package substrate; and at least one non-solder mask defined opening in the solder mask layer at a die pad location, exposing the entire surface of the die pad and sidewalls of the die pad at the non-solder mask defined opening.

Semiconductor device package with improved die pad and solder mask design

A multi-layer package substrate includes a first build-up layer including a first dielectric layer and at least a second build-up layer including a second dielectric layer on the first build-up layer. The second build-up layer includes a top metal layer with a surface configured for attaching at least one integrated circuit (IC) die. The first build-up layer includes a bottom metal layer and a first microvia extending through the first dielectric layer, and the second build-up layer includes at least a second microvia extending through the second dielectric layer that is coupled to the first microvia. A barrier ring that has a coefficient of thermal expansion (CTE) matching material relative to a CTE of a metal of the second microvia positioned along only a portion of a height of at least the second microvia including at least around a top portion of the second microvia.

Package substrate with CTE matching barrier ring around microvias

A semiconductor device includes a first body having a first coefficient of thermal expansion (CTE) and a first surface, a third body having a third CTE and a third surface facing the first surface, and a fourth surface at an angle with respect to the third surface defining an edge of the third body, and a second body having a second CTE higher than the first and the third CTE, the second body contacting the first and the third surfaces. A post having a fourth CTE lower than the second CTE, transects the second body and contacts the edge.

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Allen, TX, United States of America

Guangxu Li