Keithley Instruments, Inc.

Gregory Sobolewski

Wayne C Goeke

Michael D Rayman

John G Banaska

Pete Hulbert

Jeffrey J Trgovich

Brian D Smith

James D Bucci

James A Niemann

Martin J Rice

Dan Baker

Kevin Cawley

Matthew Holtz

Jerold A Williamson

Nathan A Schatt

Lawrence M Klubert

Justin R Noble

Aaron Ferguson

F Joseph Frese, Iv

Jin Kwang Yu

Dave Rubin

A test and measurement system includes a power device having an interface to allow connection to one or more devices under test (DUTs), and one or more processors configured to execute code that, when executed, causes the one or more processors to receive a selection between static and dynamic characterization, and to configure the power device to perform the selected one of static or dynamic characterization of the one or more DUTs, a measurement device, having a user interface, one or more processors configured to execute code that, when executed, causes the one or more processors to: receive user inputs through the user interface, the user inputs including at least the selection between static and dynamic characterization, and send the selected one of static or dynamic characterization to the power device, and a connector to connect the power device to the measurement device.

Unified measurement system for static and dynamic characterization of a device under test

A safety container for high-power, electronic device testing, the safety container including a first shell and first and second ports in the first shell. The first shell is configured to substantially surround a testing chamber sized to accommodate a device-under-test (DUT). The first shell is substantially rigid. The first port is configured to allow a fluid into the testing chamber, the second port configured to allow the fluid to exit the testing chamber.

Safety container for high power device testing over a range of temperatures

A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

Interconnect system with high current and low leakage capability

A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.

Pulsed high current technique for characterization of device under test

A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.

High performance current source power supply

Disclosed is a test and measurement instrument including a plurality of ports. The ports are configured to source a test signal into a device under test (DUT), and receive a signal response from the DUT. The test and measurement instrument also includes a measurement unit configured to measure the signal response. The test and measurement instrument further includes a processor configured to compare the signal response to a data structure. The processor also determines a classification of, and/or connections to, at least one DUT component coupled to at least one of the ports based on results of the comparison.

Automatic device detection and connection verification

A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.

Dynamically configurable remote instrument interface

A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.

Low frequency impedance measurement with source measure units

An electronic test measurement system can include a device under test (DUT) and an electronic test instrument that includes a signal input configured to receive an electrical signal from the DUT, a cooling mechanism, and a processor. The processor can be configured to determine a frequency at which the cooling mechanism should operate, cause the cooling mechanism to operate at the determined frequency, select a filter based on the determined frequency, and apply the filter to the electrical signal to reduce interference with the electrical signal resulting from mechanical vibrations of the cooling mechanism.

Rejection of mechanical vibration induced noise in electrical measurements

Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.

Triaxial DC-AC connection system

A dynamic current limiter circuit is disclosed. The dynamic current limiter includes an input node an output node. The dynamic current limiter also includes a current control valve coupled between the input and output nodes, the current control valve being configured to limit current flow between the input and output nodes based on a control input. The dynamic current limiter also includes a current change detector coupled between the input and output nodes, the current change detector being configured to detect a change in current through the input and output nodes and generate a control signal configured to drive the control input. The current control valve is configured to limit current flow between the input and output nodes in response to the current control signal.

Dynamic current limit apparatus and method

A switch protection circuit includes a discharging circuit and, optionally, a clamping circuit. The discharge circuit operates prior to the switch completing the switching action to discharge capacitance from a signal line of a cable connected to a device under test to a ground voltage. When not discharging, the discharge circuit presents low leakage to a measurement circuit so as not to interfere with such measurement. If present, the clamping circuit clamps a signal line of the cable to a guard structure of the cable so that the discharge circuit can couple both the signal line and the guard structure to ground. The protection circuit operates without significantly worsening low current performance of the measurement instrument.

Hot switch protection circuit

Bias tees, according to certain embodiments of the present invention, include switches in the AC signal path, the DC signal path, or both, to improve the capability of the bias tees to be used for high impedance AC measurement, low current DC measurement, or both. Optical control of the switches, as well as control of the switches using a DC bias present within the AC signal input to the bias tee, is described. Including a set of diodes into the DC signal path, rather than a switch, provides enhanced capability of the bias tee to be used for high impedance AC measurements.

Configurable bias tee

A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.

Growing community of inventors

Brecksville, OH, United States of America

Gregory Sobolewski