Advanced Research Corporation

Other

Gregory Lawrence Wagner

Matthew P Dugas

Theodore A Schwarz

Steven Brian Ellison

Vernon Michael Cottles

Marlow L Roberts

Various systems, devices and methods are provided for interconnection between wafers and/or chips using catch flexures. In one example, among others, a catch flexure assembly includes a first interconnect affixed to a first wafer. The first interconnect can include a female opening at a distal end of a flexible member that is configured to receive a male extension of a second interconnect affixed to a second wafer when the first wafer is aligned with the second wafer, and retain the male extension during a bonding process of the first and second flexible interconnects. The catch flexure assembly can also include bonding material disposed adjacent to the female opening, which is configured to secure the male extension in the female opening during the bonding process.

Catch flexure systems, devices and methods

The present disclosure relates generally to writing and reading data from a magnetic tape storage media and, more particularly, to a secure erasure system for the eradication of the data contained in the data tracks of a tape media such that substantially all of the data can be erased while leaving the servo bands substantially unaltered or within specification. A data tape cartridge erased with such a system can then be reused in a secure data storage environment with complete confidence that any data from a previous usage is not subject to discovery.

Erase drive system and methods of erasure for tape data cartridge

A servo head capable of verifying at least one timing based pattern printed on media is provided. The servo head includes a magnetic structure having at least one magnetic element arranged and configured to form at least one magnetic gap parallel to the timing based pattern. In one embodiment, the magnetic element is arranged and configured to have a plurality of magnetic gaps being parallel to each other but not co-linear to each other. In the second embodiment, the magnetic element is arranged and configured to have a magnetic gap being parallel to and co-linear to the timing based pattern.

Timing-based servo verify head and magnetic media made therewith

A method of recording servo information includes writing servo information in a data storage medium using a compound magnetic recording head. The compound magnetic recording head has a substrate including first and second magnetically permeable substrate portions and a substantially non-magnetic member interposed between the first and second magnetically permeable substrate portions. A magnetically permeable layer is provided over the first and second magnetically permeable substrate portions of the substrate and includes first and second writing gap features associated with the first and second substrate portions. The writing gap features are formed using a patterned mask layer over the magnetically permeable layer, wherein the patterned mask layer comprises first and second patterned gap features corresponding to the first and second writing gap features.

Methods for recording servo information

A magnetic head and method for making same which can be used for formatting or writing servo tracks or data on a tape. In one example, the magnetic head may include a magnetic thin film layer; at least one gap defined in the magnetic thin film layer; and at least one secondary sub-gap structure within the magnetic thin film layer, the at least one gap positioned proximate the at least one secondary sub-gap structure. Through the use of the secondary sub-gap structure, the gap (i.e. a record gap or channel) can be made thinner than in conventional heads.

Magnetic recording head having secondary sub-gaps

The present invention is system and method for providing a self-calibrating pressure sensor. A pressure sensor apparatus comprises a diaphragm, at least one driving element operably coupled to the diaphragm configured to induce deflection in the diaphragm, and at least one strain gauge coupled to the diaphragm. The at least one strain gauge measures the deflection of the diaphragm. Typically, the driving elements will be piezoelectric drivers and will be operably coupled to the diaphragm. A method for evaluating a pressure sensor comprises inducing deflection in a diaphragm, measuring the deflection, determining the frequency-dependent response, calculating mechanical characteristics of the diaphragm from the frequency-dependent response, and calculating a response coefficient for the diaphragm based in part on said mechanical characteristics. The response coefficient is used to evaluate the sensor. The sensor can then be re-calibrated or self-calibrated based on the response coefficient.

Self-calibrating pressure sensor

Methods and systems for data recording and reading for increasing overall tape data storage density, especially for data written in azimuth style. The principles of the invention provide servo formats and systems that allow accurate on track guidance for higher density applications and that are less sensitive to off track error. Preferred embodiments of the invention offer servo formats and systems of the invention that allows positive track and group identification at the beginning, end, and optionally periodically along the length of a tape.

Servo systems, servo heads, servo patterns for data storage especially for reading, writing, and recording in magnetic recording tape

A solid state device is formed through thin film deposition techniques which results in a self-supporting thin film layer that can have a precisely defined channel bored therethrough. The device is useful in the chacterization of polymer molecules by measuring changes in various electrical characteristics as molecules pass through the channel. To form the device, a thin film layer having various patterns of electrically conductive leads are formed on a silicon substrate. Using standard lithography techniques, a relatively large or micro-scale aperture is bored through the silicon substrate which in turn exposes a portion of the thin film layer. This process does not affect the thin film. Subsequently, a high precision material removal process is used (such as a focused ion beam) to bore a precise nano-scale aperture through the thin film layer that coincides with the removed section of the silicon substrate.

Growing community of inventors

Arden Hills, MN, United States of America

Gregory Lawrence Wagner