International Business Machines Corporation

Toshiba Medical Systems Corporation

Kabushiki Kaisha Toshiba

Gregory John Mann

Kenneth Joseph Goodnow

Serafino Bueti

Todd Edwin Leonard

Charles S Woodruff

Jason Michael Norman

Adam J Courchesne

Peter Anthony Sandon

Scott T Vento

Stanley B Stanski

Peter Albert Twombly

Gin-Chung Wang

Kai D Feng

Clarence Rosser Ogilvie

Kent C Burr

Brian John Connolly

Jonathan H Raymond

Ming-i Mark Lin

John S Jedrzejewski

A delay apparatus of an embodiment is an apparatus for delaying a signal to a plurality of chain-based time-to-digital circuits (TDCs) and includes a plurality of propagation path devices each connected to a respective one of the plurality of TDCs. Each propagation path device is configured to delay a common start signal sent to each propagation path device by a selectable amount based on a delay selection signal received by the propagation path device, and to transmit the delayed start signal to the respective one of the TDCs.

Delay apparatus, nuclear medicine imaging device, delay method, and calibration method

An apparatus for inserting delay according to an embodiment includes a signal generating circuit, a plurality of carry elements, and a delay chain circuit. The delay chain circuit includes one or more delay modules selected from the plurality of carry elements, at least one feedback line connected between at least one of the delay modules and the signal generating circuit, and a plurality of enable inputs. Each of the plurality of enable inputs is provided in a respective one of the delay modules. The delay chain circuit is configured to generate an amount of delay based on a delay selection signal that is received at the enable inputs and that selects the amount of delay, and is configured to provide the selected amount of delay to the signal generating circuit, which is configured to incorporate the delay into the start signal.

Apparatus for inserting delay, nuclear medicine imaging apparatus, method for inserting delay, and method of calibration

An apparatus for delaying a plurality of chain-based time-to-digital circuits (TDCs). The apparatus includes a plurality of propagation path devices each connected to a respective one of the plurality of TDCs, each propagation path device delays a common start signal by a selectable amount based on a delay selection signal received by the propagation path device, and transmits the delayed start signal to the respective one of the TDCs.

Apparatus for programmable insertion delay to delay chain-based time to digital circuits

A method and electronic device for outputting time values and energy of an analog input signal by dynamically determining a plurality of threshold values, comparing, using a plurality of comparator circuits, the plurality of threshold values against the analog input signal, outputting, using at least one time to digital conversion circuit connected to each of the plurality of comparator circuits, a plurality of time values, each time value output when the analog input signal meets or exceeds a threshold value of the threshold values, filtering the analog input signal, performing, using an analog-to-digital conversion circuit, analog-to-digital conversion of the filtered analog input signal to generate a digital signal, and calculating, in response to receiving a trigger signal, an energy of the digital signal.

Apparatus for analog-to-digital conversion with a high effective-sample-rate on the leading edge of a signal pulse

An apparatus and method for inserting delay into a start signal of a metastable ring oscillator chain-based time-to-digital circuit (TDC). Included therein is a signal generating circuit that generates the start signal, a plurality of carry elements connected as a chain, each of the carry elements having an input to receive a stop signal, a delay chain circuit including one or more delay modules selected from the plurality of carry elements, at least one feedback line connected between at least one of the delay modules and the signal generating circuit, and a plurality of enable inputs each provided in a respective one of the delay modules. The delay chain circuit generates an amount of delay based on a delay selection signal that is received at the enable inputs and that selects the amount of delay. The delay chain circuit additionally provides the selected amount of delay to the signal generating circuit, which incorporates the delay into the start signal.

Apparatus for programmable metastable ring oscillator period for multiple-hit delay-chain based time-to-digital circuits

A system and method for processing an analog signal output by a sensor. The system and method converting, using at least one analog-to-digital converter (ADC), the analog output signal to a digital signal, the digital signal including a plurality of samples at a predetermined resolution, detecting whether a trigger condition is met by analyzing the digital signal, detecting an event based on trigger information from the detecting whether a trigger condition is met, generating event information having time information included therein when the event is detected, defining one or more time windows based on the time information included in the event information, performing decimation on the digital signal based on the defined one or more time windows to generate a decimated signal, and outputting the decimated signal.

Apparatus for detection of a leading edge of a photo sensor output signal

A design structure including universal peripheral processor architecture on an integrated circuit (IC) includes a first data bus and a second data bus communicating with first and second ternary content addressable memory (TCAM) devices configured as state machines. First and second processors are coupled to the first bus interface logic and the second bus interface logic. First and second data storage devices communicate with the first and second processors and are coupled to the first and second data buses and communicate with each other. The TCAM devices are configured as state machines and are coupled to and adapted to interface with the processors, the data storage devices, and the bus interface logic using predefined protocols.

Structure for hardware assisted bus state transition circuit using content addressable memories

A time-to-digital converter device includes a first delay chain circuit that generates a first value corresponding to a time delay between a start signal and a stop signal. The time-to-digital converter device also includes at least one second delay chain circuits that generates a second value corresponding to a time delay between a delayed start signal and the stop signal. At least one delay element generates the delayed start signal by applying a predetermined delay to the start signal, and a combining circuit generates an output value based on the first and second values. In the time-to-digital converter according to the exemplary embodiments of the present advancements, the output value corresponds to the time delay between the start signal and the stop signal.

Apparatus for time to digital conversion

A CRC redundancy calculation circuit and a design structure including the circuit embodied in a machine readable medium are presented. The CRC redundancy calculation circuit is pipelined to run at high frequencies and configured to operate on an arbitrary multiple of the base granularity of the data packet. Additionally, the CRC redundancy calculation circuit provides the same multiple of outputs that provide intermediary output remainder values. Thus, for example, a circuit which processes 24 bytes of packet data per cycle and which the packets have a 4 byte granularity, the CRC redundancy calculation circuit provides 6 output remainder values, one for each 4 byte slice of data.

Apparatus for pipelined cyclic redundancy check circuit with multiple intermediate outputs

Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path. The invention is also directed to a design structure on which a circuit resides.

Dynamic critical path detector for digital logic circuit paths

Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path.

A CRC redundancy calculation circuit is presented which is pipelined to run at high frequencies and configured to operate on an arbitrary multiple of the base granularity of the data packet. Additionally, the CRC redundancy calculation circuit provides the same multiple of outputs that provide intermediary output remainder values. Thus, for example, a circuit which processes 24 bytes of packet data per cycle and which the packets have a 4 byte granularity, the CRC redundancy calculation circuit provides 6 output remainder values, one for each 4 byte slice of data.

A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.

System and method for system-on-chip interconnect verification

Disclosed is a design structure for an apparatus for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises functional cores each having a functional debug logic element. The cores are connected to an interconnect structure that links the functional debug logic elements. Each functional debug logic element is specifically dedicated to a function of its corresponding core, wherein the functional debug logic elements generate a table of function-specific system events. The system events are function-specific with respect to an associated core, wherein the system events include transaction events, controller events, processor events, interconnect structure arbiter events, interconnect interface core events, high speed serial link core events, and/or codec events.

Structure for task based debugger (transaction-event-job-trigger)

The embodiments of the invention provide an apparatus, method, etc. for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises functional cores each having a functional debug logic element. The cores are connected to an interconnect structure that links the functional debug logic elements. Each functional debug logic element is specifically dedicated to a function of its corresponding core, wherein the functional debug logic elements generate a table of function-specific system events. The system events are function-specific with respect to an associated core, wherein the system events include transaction events, controller events, processor events, interconnect structure arbiter events, interconnect interface core events, high speed serial link core events, and/or codec events.

Growing community of inventors

Wheaton, IL, United States of America

Gregory John Mann