International Business Machines Corporation

Gregory J Fredeman

Toshiaki Kirihata

Donald W Plass

Louis L Hsu

Kenneth J Reyer

Alan James Leslie

Rajiv V Joshi

David R Hanson

John Matthew Safran

John W Golz

Hoki Kim

Abraham Mathews

Thomas E Miller

Paul Christian Parries

Darren Lane Anand

Dinesh Kannambadi

Louis Lu-Chen Hsu

Matthew R Wordeman

Dale E Pontius

Thomas J Knips

Mark David Jacunski

Chorng-Lii Hwang

Uma Srinivasan

Matthew Steven Hyde

Dureseti Chidambarrao

Subramanian Srikanteswara Iyer

Chandrasekharan Kothandaraman

Phil Christopher Paone

Li-Kong Wang

Kevin William Gorman

Glenn David Gilda

Arthur J O'Neill

Vinod Ramadurai

David M Onsongo

Alan D Norris

Jonathan R Fales

Bishan He

David R Hansen

A computer-implemented method for memory macro disablement in a cache memory includes identifying a defective portion of a memory macro of a cache memory bank. The method includes iteratively testing each line of the memory macro, the testing including attempting at least one write operation at each line of the memory macro. The method further includes determining that an error occurred during the testing. The method further includes, in response to determining the memory macro as being defective, disabling write operations for a portion of the cache memory bank that includes the memory macro by generating a logical mask that includes at least bits comprising a compartment bit, and read address bits.

Cache array macro micro-masking

A computer-implemented method includes receiving a memory address of a memory location in a memory that has been identified to be failing. The method further includes determining that the memory location is from a particular portion of the memory. The method further includes, in response to a number of memory locations that are identified to be failing from the particular portion of the memory being below a predetermined threshold, logging the memory address in a set of failing address registers associated with the memory, otherwise, skipping the logging of the memory address in the failing address registers.

Failing address registers for built-in self tests

A method for testing a circuit includes performing, by a test engine, a test of a memory element of the circuit, the test accesses a memory location in the memory element, the memory location is identified by an address, and the memory location is accessed via a first port associated with a first port select bit. The method further includes, in response to detecting a failure associated with the memory location, determining an existing entry for the address in a failed address register, and determining that the existing entry in the failed address register is associated with a second port select bit, distinct from the first port select bit. The method further includes, in response to the second port select bit being distinct from the first port select bit, setting a multi-port failure flag for the memory element that is being tested.

Testing multi-port array in integrated circuits

A method includes receiving, at a bitline-mux driver circuit, a subarray activation (SUBA) signal and a delay signal. The bitline-mux driver circuit includes a header circuit operable to output a driver voltage to a plurality of driver circuits. The driver voltage is boosted through a voltage divider with diode header circuit based on the SUBA signal to set the driver voltage to a value above a standard supply voltage (VDD) and between a voltage bitline high (VBLH) level and a high voltage (VPP) level. The VPP level exceeds a maximum allowed voltage (VMAX) level of the driver circuits. A master wordline output of the driver circuits is driven to select a bitline mux of a computer memory module based on an address input signal, the delay signal, and the driver voltage.

Bit-line mux driver with diode header for computer memory

Techniques for voltage bitline high (VBLH) regulation for a computer memory are described herein. An aspect includes generating, by a resistor ladder and a diode compensation footer, a VBLH reference signal based on a high voltage (VPP) in a computer memory module. Another aspect includes regulating a VBLH signal based on the VBLH reference signal. Another aspect includes regulating a wordline driver voltage of the computer memory module based on the VBLH signal.

Voltage bitline high (VBLH) regulation for computer memory

Techniques for negative voltage generation for a computer memory are described herein. An aspect includes enabling a first negative word line voltage (VWL) clock generator. Another aspect includes providing, by the first VWL clock generator, based on a clock signal, a first pump clock signal to a first VWL pump, and a second pump clock signal to a second VWL pump. Another aspect includes generating a VWL based on the first VWL pump and the second VWL pump, wherein the VWL is provided to a word line driver of a computer memory module. Another aspect includes comparing the VWL to a VWL reference voltage. Another aspect includes, based on the VWL being below the VWL reference voltage, disabling the first VWL clock generator, wherein the first VWL pump and the second VWL pump are disabled based on disabling the first VWL clock generator.

Negative voltage generation for computer memory

A driver circuit and associated techniques include managing voltage driving an electronic device. An input signal having a first voltage level is received. Processes may perform level shifting of the first voltage level to a second voltage level. The second voltage level may be clamped, for instance, but a diode circuit. The second output voltage level may be programmable, as may be current and resistance levels of the driver circuit.

Dynamic high voltage driver with adjustable clamped output level

A method of operation of a high-voltage word-line driver circuit for a memory device prevents any single transistor of the driver from having the full power supply voltage from which the word-line output signal is generated, from being applied across any single transistor of the word-line driver circuit. A pair of cascode devices are connected in series with the pull-down device of the input stage and a pull-up device of the input stage, and biased using reference voltages to control the maximum voltage drop across the pull-down device when the pull-down device is off and the pull-up device is active, and to control the maximum voltage drop across the pull-up device when the pull-down device is active. The output stage also includes cascode devices that protect the output pull-down and pull-up devices, and the reference voltages that bias the input and output cascode pairs may be the same reference voltages.

Dynamic cascode-managed high-voltage word-line driver circuit

A single-ended low-swing power-savings mechanism is provided. The mechanism comprises a precharge device that turns off in an evaluation phase and a first biasing device is always on. Within the mechanism, a strength of a keeper device is changed to a first level in response to an input of the second biasing device being at a first voltage level. Within the mechanism the strength of the keeper device is changed to a second level in response to the input of the second biasing device being at a second voltage level. Responsive to receiving a (precharged voltage level read data line signal, a precharged voltage level of the first node falls faster when the keeper device is weakened to a first level. The keeper device turns on in response to receiving a LOW signal and pulls up the voltage at the first node so that a HIGH signal is output.

Single-ended low-swing power-savings mechanism with process compensation

A high-voltage word-line driver circuit for a memory device uses cascode devices to prevent any single transistor of the driver circuit from having the full power supply voltage from which the word-line output signal is generated, from being applied across any single transistor of the word-line driver circuit. A pair of cascode devices are connected in series with the pull-down device of the input stage and a pull-up device of the input stage, and biased using reference voltages to control the maximum voltage drop across the pull-down device when the pull-down device is off and the pull-up device is active, and to control the maximum voltage drop across the pull-up device when the pull-down device is active. The output stage also includes cascode devices that protect the output pull-down and pull-up devices, and the reference voltages that bias the input and output cascode pairs may be the same reference voltages.

A one-time-programmable-read-only-memory (OTPROM) is implemented in a two-dimensional array of aggressively scaled suicide migratable e-fuses. Word line selection is performed by decoding logic operating at Vwhile the bit line drive is switched between Vand a higher voltage, V, for programming. The OTPROM is thus compatible with and can be integrated with other technologies without a cost adder and supports optimization of the high current path for minimal voltage drop during fuse programming. A differential sense amplifier with a programmable reference is used for improved sense margins and can support an entire bit line rather than sense amplifiers being provided for individual fuses.

Random access electrically programmable e-fuse ROM

A row redundancy system is provided for replacing faulty wordlines of a memory array having a plurality of banks. The row redundancy system includes a remote fuse bay storing at least one faulty address corresponding to a faulty wordline of the memory array; a row fuse array for storing row fuse information corresponding to at least one bank of the memory array; and a copy logic module for copying at least one faulty address stored in the remote fuse bay into the row fuse array; wherein the copy logic module is programmed to copy the at least one faulty address into the row fuse information stored in the row fuse array corresponding to a predetermined number of banks in accordance with a selectable repair field size.

Flexible row redundancy system

A design structure embodied in a machine readable medium used in a design process includes an apparatus for sensing the state of a programmable resistive memory element device, the apparatus further including a latch device coupled to a fuse node and a reference node, the fuse node included within a fuse leg and the reference node configured within a reference resistance leg, the latch device configured to detect a differential signal developed between the reference node and the fuse node as the result of sense current passed through the fuse leg and the reference resistance leg; and the fuse and reference resistance legs further configured for first and second sensing modes, wherein the second sensing mode utilizes a different level of current than the first sensing mode.

Design structure for improving sensing margin of electrically programmable fuses

A method for determining the state of a programmable resistive memory element includes passing a first level of current through a fuse leg and a reference resistance leg of a test circuit including the programmable resistive memory element; detecting a differential signal developed between a reference node and a fuse node of the test circuit as a result of the first level of current; passing a second level of current through the fuse leg and the reference leg of a test circuit, the second level of current being higher than the first level of current so as to enable detection of trip resistance of the test circuit at a lower value than with respect to the first level of current; and detecting a differential signal developed between the reference node and the fuse node of the test circuit as a result of the second level of current.

Method for improving sensing margin of electrically programmable fuses

A row redundancy system is provided for replacing faulty wordlines of a memory array having a plurality of banks. The row redundancy system includes a remote fuse bay storing at least one faulty address corresponding to a faulty wordline of the memory array; a row fuse array for storing row fuse information corresponding to at least one bank of the memory array; and a copy logic module for copying at least one faulty address stored in the remote fuse bay into the row fuse array; the copy logic module is programmed to copy the at least one faulty address into the row fuse information stored in the row fuse array corresponding to a predetermined number of banks in accordance with a selectable repair field size.

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Wappingers Falls, NY, United States of America

Gregory J Fredeman