Tektronix, Inc.

Other

Gregory A Martin

Patrick Satarzadeh

Karen Hovakimyan

Pirooz Hojabri

Joshua J O'Brien

Daniel G Knierim

Evan A Dickinson

David D Farrell

John J Pickerd

Steven K Sullivan

Paul M Gerlach

Kristie L Veith

Terrance R Beale

George S Walker

Hungming Chang

A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

Integrated communication link testing

A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.

Real-time jitter impairment insertion for signal sources

A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.

Digital signal processing waveform synthesis for fixed sample rate signal sources

A signal generator device includes a digital signal waveform generator to produce a digital signal waveform, a first frequency band signal path having a first frequency band filter to receive the digital signal waveform and to pass first frequency band components of the digital signal waveform, and a first digital-to-analog converter to receive the first frequency band components of the digital signal waveform and to produce a first frequency band analog signal, a second frequency band signal path having a second frequency band filter to receive the digital signal waveform and to pass second frequency band components of the digital signal waveform, a second digital-to-analog converter to receive the second frequency band components of the digital signal waveform and to produce a second frequency band analog signal, and a combining element to combine the first frequency band analog signal and the second frequency band analog signal to produce a wideband analog signal. A method of generating a wideband analog signal includes generating a digital waveform, splitting the digital waveform into at least a first frequency band signal and a second frequency band signal, converting the first frequency band signal into a first frequency band analog signal, converting the second frequency band signal into a second frequency analog signal, and combining the first frequency band analog signal with the second frequency band analog signal to produce the wideband analog signal.

Split frequency band signal paths for signal sources

A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.

Dual output signal paths for signal source channels to optimize for bandwidth and amplitude range

A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.

Linear and non-linear calibration for time interleaved digital-to-analog converter

A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.

Test and measurement instrument and method of switching waveform display styles

A digital down-conversion acquisition function, includes a key spectral analysis function, in time-interleaved acquisition systems to enable acquisitions at very high sample rates and bandwidths. Digital down-conversion allows data compression into acquisition memory for down-converted complex baseband I/Q data within a given frequency range of interest. With a fixed-size acquisition memory, this enables acquisitions over a longer time span, thus enabling a lower spectral resolution bandwidth. These approaches allow down-converted complex baseband I/Q data from a narrow frequency band of interest to be acquired efficiently. Reconstruction of the acquired down-converted waveform from the time-interleaved components stored in each acquisition memory of each distributed acquisition components to result in a coherent waveform is also disclosed.

Interleaved digital down-conversion on a test and measurement instrument

A time-interleaved RF triggering method and system on a test and measurement instrument includes an acquisition component that samples a waveform, which is converted into an amplitude, phase, frequency, in-phase (I), and quadrature (Q) waveform, any of which can be used for triggering an RF digital trigger, including triggering that uses demodulation and/or decoding of the down-converted complex IQ data samples for a given protocol. Aliasing caused by subsampled data in each of the interleaved acquisition components is cancelled out using a fractional time-shift filter.

Interleaved RF triggering on a test and measurement instrument

A waveform display apparatus and method displays one or more waveforms of a signal under test at high throughput while acquiring digital data of the signal under test in a large acquisition memory. A user sets a time interval of user's interest when viewing a signal under test and sets trigger criteria through a user interface. An ADC converts the signal under test into digital data that is stored in a large acquisition memory. A trigger unit detects and produces trigger events, based on a trigger, as trigger event information during one acquisition process. A trigger event eliminator may discard some of the trigger events based on pre-trigger and post-conditions set through the interface by a user. The trigger events are recorded in a trigger list as the trigger event information. A control unit locates the digital data in the acquisition memory corresponding to the trigger events in the trigger list and displays a waveform associated with the trigger event for the time interval on a display device.

High waveform throughput with a large acquisition memory

An extendable cap for sealing a fluid inlet port having a holding plug which when removed, allows a telescoping funnel to be extended from a base section attached to the fluid inlet port. The extended telescoping funnel defines a fluid conduit through which a fluid may be guided into the fluid inlet port.

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Lake Oswego, OR, United States of America

Gregory A Martin