Advanced Micro Devices Corporation

Gregory A Constant

Jerry D Moench

Grady L Giles

Joel Thornton Irby

Floyd L Dankert

Eric W Busta

Karthik Natarajan

Alexander W Schaefer

Brian M Lay

Darren R Faulkner

Amy M Novak

A register file includes a substrate, a plurality of entries, and a plurality of read ports. Each entry includes a corresponding subset of a plurality of memory cells defined on the substrate. Each read port includes a plurality of access elements defined on the substrate. Each access element is associated with a particular common bit position of each of the entries. A plurality of entry access groups are disposed in adjacent columns on the substrate. Each entry access group is associated with a corresponding one of the plurality of entries and includes the access elements for all of the read ports for the corresponding entry.

Register file with read ports clustered by entry

An integrated circuit. The integrated circuit includes a plurality of logic circuits. The integrated circuit further includes a scan chain including a plurality of scan elements coupled in series, wherein the scan chain is configured to load stimulus data to be applied to the logic circuits for testing. The scan chain is further configured to capture data subsequent to applying the stimulus data. The integrated circuit also includes an embedded memory having a read port, wherein the read port is coupled to one or more of the plurality of logic circuits via a read path. The embedded memory includes a virtual entry having a plurality of scan-controllable storage elements. During testing, the virtual entry is operable to apply transition data to the read path in order to cause logic state transitions in the one or more logic circuits in the read path.

Apparatus for testing embedded memory read paths

A fuse cell circuit includes a first fuse and a first fuse sense circuit that senses a programming state of the first fuse and supplies an indication thereof. A sense control circuit includes a plurality of reference fuses and a second fuse sense circuit coupled to the reference fuses. The sense control circuit supplies a sense control signal to the fuse cell circuits to cause the fuse cell circuits to sense the programming state of the first fuse when the sense control signal is asserted. The sense control signal is asserted for a time period determined , at least in part, by a resistance value of the reference fuses. The integrated circuit may also include a resistance varying circuit coupled to vary a resistance value of a current path of the reference fuses according to one or more control signals.

Method and apparatus for sensing a programming state of fuses

A clock generating circuit includes a clock generator and a cycle controller. The clock generator is coupled to receive a reference oscillating signal. The clock generator provides a clock signal responsive to the reference oscillating signal. The cycle controller is coupled to provide a cycle control signal to the clock generator. The clock generator stretches a cycle of the clock signal responsive to a first value of the cycle control signal.

Stretch cycle generator

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Austin, TX, United States of America

Gregory A Constant