Agilent Technologies, Inc.

Gregor T Overney

Jean-Luc Truche

Bryan David Miller

Paul C Goodley

Richard Paul Tella

William D Fisher

David Peterson

Jun Wang

August Jon Hidalgo

William Daniel Frazer

Ruwan T Kurulugama

Joseph Charles Roark

George Stafford

Harry Bunting

Chiachen Chang

In an ion mobility-mass spectrometry (IM-MS) system, an ion mass-isolated data set is acquired by operating a mass filter to apply a mass isolation window having an m/z width such that the mass isolation window moves through a sequence of window positions, each window position being defined by an IM drift time value and an m/z ratio value. The m/z width of the mass isolation window and the sequence of window positions are determined such that the mass isolation window captures ions in a region of interest of a larger all-ions data set. The isolation window may be a wideband isolation window. In comparison to the all-ions data set, the mass-isolated data set may yield reduced ion signal interference and increased selectivity for analytes of interest.

Wideband isolation directed by ion mobility separation for analyzing compounds

An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.

Method and apparatus for surface desorption ionization by charged particles

A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.

Time of flight mass spectrometry method and apparatus

A method of MALDI sample plate processing includes capturing an image of a plate positioned outside a mass spectrometer. The image is processed to identify one or more attributes of an individual sample on the plate, where the attributes are selected from a position attribute, a geometry attribute and an internal density distribution attribute. A laser impact position is selected within the mass spectrometer based upon one or more of the attributes.

Apparatus and method for MALDI source control with external image capture

A mass spectrometry system is described. The mass spectrometry system comprises: (a) a mass spectrometer; and (b) a controller connected to the mass spectrometer. The controller is configured to: (i) direct the mass spectrometer to acquire a precursor ion spectrum of a sample stream; (ii) analyze, in real-time, the precursor ion spectrum to determine whether a first evaluation criterion is satisfied; (iii) if the first evaluation criterion is satisfied, direct the mass spectrometer to acquire a product ion spectrum of the sample stream; (iv) analyze, in real-time, the product ion spectrum to determine whether a second evaluation criterion is satisfied; and (v) if the second evaluation criterion is satisfied, analyze the product ion spectrum to assign an identification to the product ion spectrum. For certain implementations, the controller allows automated, data-dependent acquisition of mass spectrometry data to improve the efficiency at which peptidic data of interest can be acquired.

Real-time analysis of mass spectrometry data for identifying peptidic data of interest

The invention provides an apparatus for producing an image of a global surface of an ion source sample plate that is exterior to an ion source. In general terms, the apparatus contains a sample plate for an ion source, an imaging device (e.g., a CCD or CMOS camera) and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The apparatus may be present at a location that is remote to the ion source.

MALDI sample plate imaging workstation

Systems and methods for optimizing the analysis of co-eluting compounds during a cycle of a tandem mass spectrometer system are provided. The tandem mass spectrometer system switches fast from analyzing one compound ion to analyzing another compound ion and from one collision cell energy to another. The fast switching allows complex sampling patterns that improve coverage of the ionic signal of the co-eluting compounds while allowing different collision cell energies to be analyzed.

Multichannel rapid sampling of chromatographic peaks by tandem mass spectrometer

The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also contain an imaging device, e.g., a CCD or CMOS camera or the like, for viewing the area. In one embodiment, the imaging device may be connected to a display, e.g., a video monitor. Methods and mass spectrometry systems empliying the ion source are also provided.

Ion source sample plate illumination system

A MALDI ion source includes a sample plate for receiving a sample, a laser for producing laser radiation to ionize the sample, a first optical element arranged so as to direct the laser radiation along a first optical path toward the target area, and a second optical element arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements are arranged that light that is reflected from the target area travels along the first optical path through the first and second optical elements, the first optical element reflecting the laser radiation along a first direction and transmitting the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements.

Apparatus for combined laser focusing and spot imaging for MALDI

Methods for specifying the layout of a MALDI sample plate are provided. In general, the methods involve creating a file containing sample plate layout parameters that describe the layout of a MALDI sample plate, and storing the file on a computer readable medium prior to placement of the MALDI sample plate into a MALDI ion source. In many embodiments, the file includes information about the size or shape of the sample plate, or information about the size, shape or position of a sample on the sample plate. In many embodiments, a MALDI sample plate is placed in a MALDI ion source and a stored layout file for the sample plate is accessed and used to position an area of the sample plate in a laser beam. The subject methods, kits and apparatus find use in a variety of different mass spectrometry applications.

User customizable plate handling for MALDI mass spectrometry

The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.

Increased depth of field for high resolution imaging for a matrix-based ion source

A mass spectrometer system comprises a flight tube having an operational length, a measurement device for measuring a variation in the longitudinal length of the flight tube, means for compensating for the measured variation in the longitudinal flight tube length, and a detector positioned near a downstream end of the flight tube. The measurement device comprises an optical interferometer, and may specifically comprise a Michelson interferometer. In a first embodiment, the mass spectrometer system includes an actuator coupled to the measurement device and the detector for moving the detector in a longitudinal direction to compensate for the measured variation in the operational flight tube length. In a second embodiment, the mass spectrometer system includes a processor coupled to the measurement device configured to calculate analyte ion mass to charge ratio. The processor is configured to modify a calculation of analyte ion mass to charge ratio using the measured variation in operational flight tube length.

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San Jose, CA, United States of America

Gregor T Overney