Exelis Inc.

Greg Burdick

Eugene George Olczak

Cormic K Merle

An apparatus for testing an optical surface comprising an array of holograms. The array includes a plurality of individual holograms arranged in an M&#xd7;N format, in which M is the number of rows and N is the number of columns in the array. The array of holograms is positioned between the optical surface and a wavefront sensor. The array of holograms reflects a reference beam back to the wavefront sensor, and transmits a test beam to the optical surface. The array of holograms also receives the test beam reflected from the optical surface and transfers the test beam back to the wavefront sensor.

Growing community of inventors

Rochester, NY, United States of America

Greg Burdick